Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X-Ray in Transmission Study

Phu Tran Phong Le, Kevin Hofhuis, Abhimanyu Rana, Mark Huijben, Hans Hilgenkamp, Guus A.J.H.M. Rijnders, Johan E. ten Elshof, Gertjan Koster*, Nicolas Gauquelin*, Gunnar Lumbeeck, Christian Schüßler-Langeheine, Horia Popescu, Franck Fortuna, Steef Smit, Xanthe H. Verbeek, Georgios Araizi-Kanoutas, Shrawan Mishra, Igor Vaskivskyi, Hermann A. Dürr, Mark S. Golden*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

10 Downloads (Pure)

Abstract

Vanadium dioxide (VO2) is a much-discussed material for oxide electronics and neuromorphic computing applications. Here, heteroepitaxy of VO2 is realized on top of oxide nanosheets that cover either the amorphous silicon dioxide surfaces of Si substrates or X-ray transparent silicon nitride membranes. The out-of-plane orientation of the VO2 thin films is controlled at will between (011)M1/(110)R and (−402)M1/(002)R by coating the bulk substrates with Ti0.87O2 and NbWO6 nanosheets, respectively, prior to VO2 growth. Temperature-dependent X-ray diffraction and automated crystal orientation mapping in microprobe transmission electron microscope mode (ACOM-TEM) characterize the high phase purity, the crystallographic and orientational properties of the VO2 films. Transport measurements and soft X-ray absorption in transmission are used to probe the VO2 metal–insulator transition, showing results of a quality equal to those from epitaxial films on bulk single-crystal substrates. Successful local manipulation of two different VO2 orientations on a single substrate is demonstrated using VO2 grown on lithographically patterned lines of Ti0.87O2 and NbWO6 nanosheets investigated by electron backscatter diffraction. Finally, the excellent suitability of these nanosheet-templated VO2 films for advanced lensless imaging of the metal–insulator transition using coherent soft X-rays is discussed.

Original languageEnglish
Article number1900028
JournalAdvanced functional materials
Volume30
Issue number1
Early online date31 Oct 2019
DOIs
Publication statusPublished - 3 Jan 2020

Fingerprint

Nanosheets
Wave transmission
dioxides
Vanadium
vanadium
Microscopic examination
Diffraction
microscopy
X rays
Substrates
diffraction
Oxides
x rays
oxides
Epitaxial films
X ray absorption
Amorphous silicon
Silicon nitride
Epitaxial growth
silicon nitrides

Keywords

  • UT-Hybrid-D
  • nanosheets
  • transmission
  • vanadium dioxide
  • X-ray absorption
  • lensless imaging

Cite this

Le, Phu Tran Phong ; Hofhuis, Kevin ; Rana, Abhimanyu ; Huijben, Mark ; Hilgenkamp, Hans ; Rijnders, Guus A.J.H.M. ; ten Elshof, Johan E. ; Koster, Gertjan ; Gauquelin, Nicolas ; Lumbeeck, Gunnar ; Schüßler-Langeheine, Christian ; Popescu, Horia ; Fortuna, Franck ; Smit, Steef ; Verbeek, Xanthe H. ; Araizi-Kanoutas, Georgios ; Mishra, Shrawan ; Vaskivskyi, Igor ; Dürr, Hermann A. ; Golden, Mark S. / Tailoring Vanadium Dioxide Film Orientation Using Nanosheets : a Combined Microscopy, Diffraction, Transport, and Soft X-Ray in Transmission Study. In: Advanced functional materials. 2020 ; Vol. 30, No. 1.
@article{82dc7d16d30d408798a1b9d01589acba,
title = "Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X-Ray in Transmission Study",
abstract = "Vanadium dioxide (VO2) is a much-discussed material for oxide electronics and neuromorphic computing applications. Here, heteroepitaxy of VO2 is realized on top of oxide nanosheets that cover either the amorphous silicon dioxide surfaces of Si substrates or X-ray transparent silicon nitride membranes. The out-of-plane orientation of the VO2 thin films is controlled at will between (011)M1/(110)R and (−402)M1/(002)R by coating the bulk substrates with Ti0.87O2 and NbWO6 nanosheets, respectively, prior to VO2 growth. Temperature-dependent X-ray diffraction and automated crystal orientation mapping in microprobe transmission electron microscope mode (ACOM-TEM) characterize the high phase purity, the crystallographic and orientational properties of the VO2 films. Transport measurements and soft X-ray absorption in transmission are used to probe the VO2 metal–insulator transition, showing results of a quality equal to those from epitaxial films on bulk single-crystal substrates. Successful local manipulation of two different VO2 orientations on a single substrate is demonstrated using VO2 grown on lithographically patterned lines of Ti0.87O2 and NbWO6 nanosheets investigated by electron backscatter diffraction. Finally, the excellent suitability of these nanosheet-templated VO2 films for advanced lensless imaging of the metal–insulator transition using coherent soft X-rays is discussed.",
keywords = "UT-Hybrid-D, nanosheets, transmission, vanadium dioxide, X-ray absorption, lensless imaging",
author = "Le, {Phu Tran Phong} and Kevin Hofhuis and Abhimanyu Rana and Mark Huijben and Hans Hilgenkamp and Rijnders, {Guus A.J.H.M.} and {ten Elshof}, {Johan E.} and Gertjan Koster and Nicolas Gauquelin and Gunnar Lumbeeck and Christian Sch{\"u}{\ss}ler-Langeheine and Horia Popescu and Franck Fortuna and Steef Smit and Verbeek, {Xanthe H.} and Georgios Araizi-Kanoutas and Shrawan Mishra and Igor Vaskivskyi and D{\"u}rr, {Hermann A.} and Golden, {Mark S.}",
note = "Wiley deal",
year = "2020",
month = "1",
day = "3",
doi = "10.1002/adfm.201900028",
language = "English",
volume = "30",
journal = "Advanced functional materials",
issn = "1616-301X",
publisher = "Wiley-VCH Verlag",
number = "1",

}

Le, PTP, Hofhuis, K, Rana, A, Huijben, M, Hilgenkamp, H, Rijnders, GAJHM, ten Elshof, JE, Koster, G, Gauquelin, N, Lumbeeck, G, Schüßler-Langeheine, C, Popescu, H, Fortuna, F, Smit, S, Verbeek, XH, Araizi-Kanoutas, G, Mishra, S, Vaskivskyi, I, Dürr, HA & Golden, MS 2020, 'Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X-Ray in Transmission Study', Advanced functional materials, vol. 30, no. 1, 1900028. https://doi.org/10.1002/adfm.201900028

Tailoring Vanadium Dioxide Film Orientation Using Nanosheets : a Combined Microscopy, Diffraction, Transport, and Soft X-Ray in Transmission Study. / Le, Phu Tran Phong; Hofhuis, Kevin; Rana, Abhimanyu; Huijben, Mark; Hilgenkamp, Hans; Rijnders, Guus A.J.H.M.; ten Elshof, Johan E.; Koster, Gertjan; Gauquelin, Nicolas; Lumbeeck, Gunnar; Schüßler-Langeheine, Christian; Popescu, Horia; Fortuna, Franck; Smit, Steef; Verbeek, Xanthe H.; Araizi-Kanoutas, Georgios; Mishra, Shrawan; Vaskivskyi, Igor; Dürr, Hermann A.; Golden, Mark S.

In: Advanced functional materials, Vol. 30, No. 1, 1900028, 03.01.2020.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Tailoring Vanadium Dioxide Film Orientation Using Nanosheets

T2 - a Combined Microscopy, Diffraction, Transport, and Soft X-Ray in Transmission Study

AU - Le, Phu Tran Phong

AU - Hofhuis, Kevin

AU - Rana, Abhimanyu

AU - Huijben, Mark

AU - Hilgenkamp, Hans

AU - Rijnders, Guus A.J.H.M.

AU - ten Elshof, Johan E.

AU - Koster, Gertjan

AU - Gauquelin, Nicolas

AU - Lumbeeck, Gunnar

AU - Schüßler-Langeheine, Christian

AU - Popescu, Horia

AU - Fortuna, Franck

AU - Smit, Steef

AU - Verbeek, Xanthe H.

AU - Araizi-Kanoutas, Georgios

AU - Mishra, Shrawan

AU - Vaskivskyi, Igor

AU - Dürr, Hermann A.

AU - Golden, Mark S.

N1 - Wiley deal

PY - 2020/1/3

Y1 - 2020/1/3

N2 - Vanadium dioxide (VO2) is a much-discussed material for oxide electronics and neuromorphic computing applications. Here, heteroepitaxy of VO2 is realized on top of oxide nanosheets that cover either the amorphous silicon dioxide surfaces of Si substrates or X-ray transparent silicon nitride membranes. The out-of-plane orientation of the VO2 thin films is controlled at will between (011)M1/(110)R and (−402)M1/(002)R by coating the bulk substrates with Ti0.87O2 and NbWO6 nanosheets, respectively, prior to VO2 growth. Temperature-dependent X-ray diffraction and automated crystal orientation mapping in microprobe transmission electron microscope mode (ACOM-TEM) characterize the high phase purity, the crystallographic and orientational properties of the VO2 films. Transport measurements and soft X-ray absorption in transmission are used to probe the VO2 metal–insulator transition, showing results of a quality equal to those from epitaxial films on bulk single-crystal substrates. Successful local manipulation of two different VO2 orientations on a single substrate is demonstrated using VO2 grown on lithographically patterned lines of Ti0.87O2 and NbWO6 nanosheets investigated by electron backscatter diffraction. Finally, the excellent suitability of these nanosheet-templated VO2 films for advanced lensless imaging of the metal–insulator transition using coherent soft X-rays is discussed.

AB - Vanadium dioxide (VO2) is a much-discussed material for oxide electronics and neuromorphic computing applications. Here, heteroepitaxy of VO2 is realized on top of oxide nanosheets that cover either the amorphous silicon dioxide surfaces of Si substrates or X-ray transparent silicon nitride membranes. The out-of-plane orientation of the VO2 thin films is controlled at will between (011)M1/(110)R and (−402)M1/(002)R by coating the bulk substrates with Ti0.87O2 and NbWO6 nanosheets, respectively, prior to VO2 growth. Temperature-dependent X-ray diffraction and automated crystal orientation mapping in microprobe transmission electron microscope mode (ACOM-TEM) characterize the high phase purity, the crystallographic and orientational properties of the VO2 films. Transport measurements and soft X-ray absorption in transmission are used to probe the VO2 metal–insulator transition, showing results of a quality equal to those from epitaxial films on bulk single-crystal substrates. Successful local manipulation of two different VO2 orientations on a single substrate is demonstrated using VO2 grown on lithographically patterned lines of Ti0.87O2 and NbWO6 nanosheets investigated by electron backscatter diffraction. Finally, the excellent suitability of these nanosheet-templated VO2 films for advanced lensless imaging of the metal–insulator transition using coherent soft X-rays is discussed.

KW - UT-Hybrid-D

KW - nanosheets

KW - transmission

KW - vanadium dioxide

KW - X-ray absorption

KW - lensless imaging

UR - http://www.scopus.com/inward/record.url?scp=85074571697&partnerID=8YFLogxK

U2 - 10.1002/adfm.201900028

DO - 10.1002/adfm.201900028

M3 - Article

AN - SCOPUS:85074571697

VL - 30

JO - Advanced functional materials

JF - Advanced functional materials

SN - 1616-301X

IS - 1

M1 - 1900028

ER -