Tapping mode atomic force microscopy in liquid

Constant A.J. Putman; Kees O. van der Werf; Bart G. de Grooth; Niek F. van Hulst; Jan Greve

doi:10.1063/1.111597

Tapping mode atomic force microscopy in liquid

Constant A.J. Putman, Kees O. van der Werf, Bart G. de Grooth, Niek F. van Hulst, Jan Greve

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Abstract

We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFM in liquid. Acoustic modes in the liquid excite the cantilever. on soft samples, e.g., biological material, this tapping mode AFM is much more gentle than the regular contact mode AFM. Not only is the destructive influence of the lateral forces minimized, but more important, the intrinsic viscoelastic properties of the sample itself are effectively used to ''harden'' the soft sample.

Original language	English
Pages (from-to)	2454-2456
Number of pages	3
Journal	Applied physics letters
Volume	64
Issue number	18
DOIs	https://doi.org/10.1063/1.111597
Publication status	Published - 1994

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title = "Tapping mode atomic force microscopy in liquid",

abstract = "We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFM in liquid. Acoustic modes in the liquid excite the cantilever. on soft samples, e.g., biological material, this tapping mode AFM is much more gentle than the regular contact mode AFM. Not only is the destructive influence of the lateral forces minimized, but more important, the intrinsic viscoelastic properties of the sample itself are effectively used to ''harden'' the soft sample.",

author = "Putman, {Constant A.J.} and {van der Werf}, {Kees O.} and {de Grooth}, {Bart G.} and {van Hulst}, {Niek F.} and Jan Greve",

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T1 - Tapping mode atomic force microscopy in liquid

AU - Putman, Constant A.J.

AU - van der Werf, Kees O.

AU - de Grooth, Bart G.

AU - van Hulst, Niek F.

AU - Greve, Jan

PY - 1994

Y1 - 1994

N2 - We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFM in liquid. Acoustic modes in the liquid excite the cantilever. on soft samples, e.g., biological material, this tapping mode AFM is much more gentle than the regular contact mode AFM. Not only is the destructive influence of the lateral forces minimized, but more important, the intrinsic viscoelastic properties of the sample itself are effectively used to ''harden'' the soft sample.

AB - We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFM in liquid. Acoustic modes in the liquid excite the cantilever. on soft samples, e.g., biological material, this tapping mode AFM is much more gentle than the regular contact mode AFM. Not only is the destructive influence of the lateral forces minimized, but more important, the intrinsic viscoelastic properties of the sample itself are effectively used to ''harden'' the soft sample.

U2 - 10.1063/1.111597

DO - 10.1063/1.111597

M3 - Article

SN - 0003-6951

VL - 64

SP - 2454

EP - 2456

JO - Applied physics letters

JF - Applied physics letters

IS - 18

ER -

Tapping mode atomic force microscopy in liquid

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