TASTE: a tool for analog system testability evaluation

G.J. Hemink, B.W. Meijer, Hans G. Kerkhoff

    Research output: Contribution to conferencePaper

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    Abstract

    A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm finds sets of inseparable parameters and determines whether it is possible to calculate a certain parameter with efficient accuracy. It also determines a subset of appropriate measurements if redundant measurements are present
    Original languageUndefined
    Pages829-838
    DOIs
    Publication statusPublished - 1988
    EventInternational Test Conference, 1988 - Washington, DC
    Duration: 12 Sep 198814 Sep 1988

    Conference

    ConferenceInternational Test Conference, 1988
    Period12/09/8814/09/88
    Other12-14 Sept. 1988

    Keywords

    • IR-56108

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