TASTE: a tool for analog system testability evaluation

G.J. Hemink; B.W. Meijer; H.G. Kerkhoff

doi:10.1109/TEST.1988.207870

TASTE: a tool for analog system testability evaluation

G.J. Hemink
, B.W. Meijer
, H.G. Kerkhoff

Research output: Contribution to conference › Paper

7 Citations (Scopus)

264 Downloads (Pure)

Abstract

A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm finds sets of inseparable parameters and determines whether it is possible to calculate a certain parameter with efficient accuracy. It also determines a subset of appropriate measurements if redundant measurements are present

Original language	English
Pages	829-838
DOIs	https://doi.org/10.1109/TEST.1988.207870
Publication status	Published - 1988
Event	International Test Conference, 1988 - Washington, DC Duration: 12 Sept 1988 → 14 Sept 1988

Conference

Conference	International Test Conference, 1988
Period	12/09/88 → 14/09/88
Other	12-14 Sept. 1988

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10.1109/TEST.1988.207870

ArticleFinal published version, 650 KB

Cite this

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title = "TASTE: a tool for analog system testability evaluation",

abstract = "A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm finds sets of inseparable parameters and determines whether it is possible to calculate a certain parameter with efficient accuracy. It also determines a subset of appropriate measurements if redundant measurements are present",

author = "G.J. Hemink and B.W. Meijer and H.G. Kerkhoff",

year = "1988",

doi = "10.1109/TEST.1988.207870",

language = "English",

pages = "829--838",

note = "International Test Conference, 1988 ; Conference date: 12-09-1988 Through 14-09-1988",

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AU - Hemink, G.J.

AU - Meijer, B.W.

AU - Kerkhoff, H.G.

PY - 1988

Y1 - 1988

N2 - A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm finds sets of inseparable parameters and determines whether it is possible to calculate a certain parameter with efficient accuracy. It also determines a subset of appropriate measurements if redundant measurements are present

AB - A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm finds sets of inseparable parameters and determines whether it is possible to calculate a certain parameter with efficient accuracy. It also determines a subset of appropriate measurements if redundant measurements are present

U2 - 10.1109/TEST.1988.207870

DO - 10.1109/TEST.1988.207870

M3 - Paper

SP - 829

EP - 838

T2 - International Test Conference, 1988

Y2 - 12 September 1988 through 14 September 1988

ER -

TASTE: a tool for analog system testability evaluation

Abstract

Conference

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