Technologies and microstructures for separation techniques in chemical analysis

Vincent L. Spiering, V.L. Spiering, Theodorus S.J. Lammerink, Henricus V. Jansen, Albert van den Berg, J.H.J. Fluitman

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    1 Citation (Scopus)
    14 Downloads (Pure)

    Abstract

    The possibilities for microtechnology in chemical analysis and separation techniques are discussed. The combination of the materials and the dimensions of structures can limit the sample and waste volumes on the one hand, but also increases the performance of the chemical systems. Especially in high performance chromatography separation systems, where the separation quality is directly depending on the length to width ratio of the fluid channels, there is a large potential for applications. Novel technologies as well as demonstrator devices for different applications will be presented in this paper. Finally, a modular concept for microfluidic systems, in which these micromachined structures can be incorporated, is described and illustrated with a demonstrator.
    Original languageUndefined
    Title of host publicationProceedings of SPIE - The International Society for Optical Engineering - Micromachined Devices and Components II
    Place of PublicationBellingham, WA USA
    PublisherSPIE - The International Society for Optical Engineering
    Pages91-100
    Number of pages10
    ISBN (Print)9780819422804
    DOIs
    Publication statusPublished - Oct 1996

    Publication series

    NameProceedings of SPIE 2882

    Keywords

    • METIS-112889
    • EWI-13597
    • IR-16007

    Cite this

    Spiering, V. L., Spiering, V. L., Lammerink, T. S. J., Jansen, H. V., van den Berg, A., & Fluitman, J. H. J. (1996). Technologies and microstructures for separation techniques in chemical analysis. In Proceedings of SPIE - The International Society for Optical Engineering - Micromachined Devices and Components II (pp. 91-100). (Proceedings of SPIE 2882). Bellingham, WA USA: SPIE - The International Society for Optical Engineering. https://doi.org/10.1117/12.250726