We use in-situ ellipsometry to study the structural and chemical evolution of thin films as function of the temperature (‘Tellipsometry’). Particular focus is on organic, inorganic, and hybrid materials that are relevant to artificial membrane fabrication and operation. Our poster shows some illustrative examples.
|Number of pages||1|
|Publication status||Published - 2014|
|Event||8th Workshop Ellipsometry 2014 - Dresden, Germany|
Duration: 10 Mar 2014 → 12 Mar 2014
Conference number: 8
|Workshop||8th Workshop Ellipsometry 2014|
|Period||10/03/14 → 12/03/14|
Kappert, E. J., Ogieglo, W., Raaijmakers, M., Koziara, B., Wormeester, H., & Benes, N. E. (2014). Tellipsometry in Twente: Dynamics of Thin Film Membranes Under Applied Temperature Profiles. Poster session presented at 8th Workshop Ellipsometry 2014, Dresden, Germany.