Tellipsometry in Twente: Dynamics of Thin Film Membranes Under Applied Temperature Profiles

Emiel J. Kappert, Wojciech Ogieglo, Michiel Raaijmakers, Beata Koziara, Herbert Wormeester, Nieck E. Benes

Research output: Contribution to conferencePoster

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Abstract

We use in-situ ellipsometry to study the structural and chemical evolution of thin films as function of the temperature (‘Tellipsometry’). Particular focus is on organic, inorganic, and hybrid materials that are relevant to artificial membrane fabrication and operation. Our poster shows some illustrative examples.
Original languageEnglish
Number of pages1
Publication statusPublished - 2014
Event8th Workshop Ellipsometry 2014 - Dresden, Germany
Duration: 10 Mar 201412 Mar 2014
Conference number: 8

Workshop

Workshop8th Workshop Ellipsometry 2014
CountryGermany
CityDresden
Period10/03/1412/03/14

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    Kappert, E. J., Ogieglo, W., Raaijmakers, M., Koziara, B., Wormeester, H., & Benes, N. E. (2014). Tellipsometry in Twente: Dynamics of Thin Film Membranes Under Applied Temperature Profiles. Poster session presented at 8th Workshop Ellipsometry 2014, Dresden, Germany.