Tellipsometry in Twente: Dynamics of Thin Film Membranes Under Applied Temperature Profiles

Emiel J. Kappert; Wojciech Ogieglo; Michiel Raaijmakers; Beata Koziara; Herbert  Wormeester; Nieck E. Benes

Tellipsometry in Twente: Dynamics of Thin Film Membranes Under Applied Temperature Profiles

Emiel J. Kappert, Wojciech Ogieglo, Michiel Raaijmakers, Beata Koziara, Herbert Wormeester, Nieck E. Benes

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Abstract

We use in-situ ellipsometry to study the structural and chemical evolution of thin films as function of the temperature (‘Tellipsometry’). Particular focus is on organic, inorganic, and hybrid materials that are relevant to artificial membrane fabrication and operation. Our poster shows some illustrative examples.

Original language	English
Number of pages	1
Publication status	Published - 2014
Event	8th Workshop Ellipsometry 2014 - Dresden, Germany Duration: 10 Mar 2014 → 12 Mar 2014 Conference number: 8

Workshop

Workshop	8th Workshop Ellipsometry 2014
Country/Territory	Germany
City	Dresden
Period	10/03/14 → 12/03/14

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title = "Tellipsometry in Twente: Dynamics of Thin Film Membranes Under Applied Temperature Profiles",

abstract = "We use in-situ ellipsometry to study the structural and chemical evolution of thin films as function of the temperature ({\textquoteleft}Tellipsometry{\textquoteright}). Particular focus is on organic, inorganic, and hybrid materials that are relevant to artificial membrane fabrication and operation. Our poster shows some illustrative examples.",

author = "Kappert, {Emiel J.} and Wojciech Ogieglo and Michiel Raaijmakers and Beata Koziara and Herbert Wormeester and Benes, {Nieck E.}",

year = "2014",

language = "English",

note = "8th Workshop Ellipsometry 2014 ; Conference date: 10-03-2014 Through 12-03-2014",

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TY - CONF

T1 - Tellipsometry in Twente

T2 - 8th Workshop Ellipsometry 2014

AU - Kappert, Emiel J.

AU - Ogieglo, Wojciech

AU - Raaijmakers, Michiel

AU - Koziara, Beata

AU - Wormeester, Herbert

AU - Benes, Nieck E.

N1 - Conference code: 8

PY - 2014

Y1 - 2014

N2 - We use in-situ ellipsometry to study the structural and chemical evolution of thin films as function of the temperature (‘Tellipsometry’). Particular focus is on organic, inorganic, and hybrid materials that are relevant to artificial membrane fabrication and operation. Our poster shows some illustrative examples.

AB - We use in-situ ellipsometry to study the structural and chemical evolution of thin films as function of the temperature (‘Tellipsometry’). Particular focus is on organic, inorganic, and hybrid materials that are relevant to artificial membrane fabrication and operation. Our poster shows some illustrative examples.

M3 - Poster

Y2 - 10 March 2014 through 12 March 2014

ER -

Tellipsometry in Twente: Dynamics of Thin Film Membranes Under Applied Temperature Profiles

Abstract

Workshop

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