TEM investigation of YBa2Cu3O7 thin films on SrTiO3 bicrystals

C. Traeholt, J.G. Wen, H.W. Zandbergen, Y. Shen, Johannes W.M. Hilgenkamp

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Abstract

YBa2Cu3O7 films in c-axis orientation on bicrystalline SrTiO3 substrates are investigated by TEM. The films and the substrates are examined in cross-section and in plane view. The grain boundary of the bicrystal substrate contains (110) faceted voids, but is otherwise straight on a nanometer scale. Contrary to this, the film grain boundary is not straight grain boundary can be up to 100 nm for a 100 nm thick film. The deviation from the intended position of the YBCO grain boundary can already occur at the film/substrate interface where it can be as much as ±50 nm.
Original languageUndefined
Pages (from-to)425-434
Number of pages10
JournalPhysica C
Volume230
Issue number230
DOIs
Publication statusPublished - 1994

Keywords

  • METIS-128576
  • IR-23777

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