Temperature Acceleration of Thin Gate-Oxide Degradation

Cora Salm; V.E. Houtsma; F.G. Kuper; P.H. Woerlee

Temperature Acceleration of Thin Gate-Oxide Degradation

Cora Salm, V.E. Houtsma, F.G. Kuper, P.H. Woerlee

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the SAFE Conference
Place of Publication	Veldhoven, the Netherlands
Pages	174-177
Number of pages	4
Publication status	Published - 28 Nov 2001
Event	4th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2001 - Veldhoven, Netherlands Duration: 28 Nov 2001 → 30 Nov 2001

Workshop

Workshop	4th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2001
Country/Territory	Netherlands
City	Veldhoven
Period	28/11/01 → 30/11/01

Keywords

METIS-200748

Cite this

@inproceedings{b61095ff3ee246f8ace3209e1e02ca3b,

title = "Temperature Acceleration of Thin Gate-Oxide Degradation",

keywords = "METIS-200748",

author = "Cora Salm and V.E. Houtsma and F.G. Kuper and P.H. Woerlee",

year = "2001",

month = nov,

day = "28",

language = "Undefined",

isbn = "90-73461-29-4",

pages = "174--177",

booktitle = "Proceedings of the SAFE Conference",

note = "4th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2001 ; Conference date: 28-11-2001 Through 30-11-2001",

}

TY - GEN

T1 - Temperature Acceleration of Thin Gate-Oxide Degradation

AU - Salm, Cora

AU - Houtsma, V.E.

AU - Kuper, F.G.

AU - Woerlee, P.H.

PY - 2001/11/28

Y1 - 2001/11/28

KW - METIS-200748

M3 - Conference contribution

SN - 90-73461-29-4

SP - 174

EP - 177

BT - Proceedings of the SAFE Conference

CY - Veldhoven, the Netherlands

T2 - 4th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2001

Y2 - 28 November 2001 through 30 November 2001

ER -