Temperature calibration procedure for thin film substrates for thermo-ellipsometric analysis using melting point standards

Emiel J. Kappert, Michiel J.Y. Raaijmakers, Wojciech Ogieglo, Arian Nijmeijer, Cindy Huiskes, Nieck E. Benes

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Abstract

Precise and accurate temperature control is pertinent to studying thermally activated processes in thin films. Here, we present a calibration method for the substrate–film interface temperature using spectroscopic ellipsometry. The method is adapted from temperature calibration methods that are well developed for thermogravimetric analysis and differential scanning calorimetry instruments, and is based on probing a transition temperature. Indium, lead, and zinc could be spread on a substrate, and the phase transition of these metals could be detected by a change in the C signal of the ellipsometer. For water, the phase transition could be detected by a loss of signal intensity as a result of light scattering by the ice crystals. The combined approach allowed for construction of a linear calibration curve with an accuracy of 1.3 C or lower over the full temperature range.
Original languageEnglish
Pages (from-to)29-32
JournalThermochimica acta
Volume601
DOIs
Publication statusPublished - 2015

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Thermoanalysis
melting points
Melting point
Calibration
Thin films
Substrates
thin films
Phase transitions
Indium
ellipsometers
Spectroscopic ellipsometry
temperature control
Ice
Temperature control
Light scattering
Temperature
Superconducting transition temperature
ellipsometry
temperature
indium

Cite this

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title = "Temperature calibration procedure for thin film substrates for thermo-ellipsometric analysis using melting point standards",
abstract = "Precise and accurate temperature control is pertinent to studying thermally activated processes in thin films. Here, we present a calibration method for the substrate–film interface temperature using spectroscopic ellipsometry. The method is adapted from temperature calibration methods that are well developed for thermogravimetric analysis and differential scanning calorimetry instruments, and is based on probing a transition temperature. Indium, lead, and zinc could be spread on a substrate, and the phase transition of these metals could be detected by a change in the C signal of the ellipsometer. For water, the phase transition could be detected by a loss of signal intensity as a result of light scattering by the ice crystals. The combined approach allowed for construction of a linear calibration curve with an accuracy of 1.3 C or lower over the full temperature range.",
author = "Kappert, {Emiel J.} and Raaijmakers, {Michiel J.Y.} and Wojciech Ogieglo and Arian Nijmeijer and Cindy Huiskes and Benes, {Nieck E.}",
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Temperature calibration procedure for thin film substrates for thermo-ellipsometric analysis using melting point standards. / Kappert, Emiel J.; Raaijmakers, Michiel J.Y.; Ogieglo, Wojciech; Nijmeijer, Arian; Huiskes, Cindy; Benes, Nieck E.

In: Thermochimica acta, Vol. 601, 2015, p. 29-32.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Temperature calibration procedure for thin film substrates for thermo-ellipsometric analysis using melting point standards

AU - Kappert, Emiel J.

AU - Raaijmakers, Michiel J.Y.

AU - Ogieglo, Wojciech

AU - Nijmeijer, Arian

AU - Huiskes, Cindy

AU - Benes, Nieck E.

PY - 2015

Y1 - 2015

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AB - Precise and accurate temperature control is pertinent to studying thermally activated processes in thin films. Here, we present a calibration method for the substrate–film interface temperature using spectroscopic ellipsometry. The method is adapted from temperature calibration methods that are well developed for thermogravimetric analysis and differential scanning calorimetry instruments, and is based on probing a transition temperature. Indium, lead, and zinc could be spread on a substrate, and the phase transition of these metals could be detected by a change in the C signal of the ellipsometer. For water, the phase transition could be detected by a loss of signal intensity as a result of light scattering by the ice crystals. The combined approach allowed for construction of a linear calibration curve with an accuracy of 1.3 C or lower over the full temperature range.

U2 - 10.1016/j.tca.2014.12.017

DO - 10.1016/j.tca.2014.12.017

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VL - 601

SP - 29

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JO - Thermochimica acta

JF - Thermochimica acta

SN - 0040-6031

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