Temperature dependence of universal conductance fluctuations in narrow mesoscopic Si inversion layers

J.R. Gao*, J. Caro, A.H. Verbruggen, S. Radelaar, J. Middelhoek

*Corresponding author for this work

    Research output: Contribution to journalArticleAcademicpeer-review

    12 Citations (Scopus)
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    Abstract

    The temperature dependence of magnetoconductance fluctuations in narrow mesoscopic silicon inversion layers (length 4.3 m, width 0.14 and 0.43 m) has been studied. The magnitude and magnetic correlation length of the fluctuations was measured in the temperature range T=0.24.2 K and for magnetic fields up to 3 T. Weak-localization experiments were performed for an independent determination of the inelastic diffusion length Lin. When Lin exceeds the channel width W [quasi-one-dimensional (quasi-1D)] the experimental temperature dependence of the fluctuation amplitude and magnetic correlation length is very well described by the theory for universal conductance fluctuations of Lee and Stone. In case Lin<W (quasi-2D) a good agreement with this theory is found for the temperature dependence of the fluctuation amplitude.

    Original languageEnglish
    Pages (from-to)11676-11682
    Number of pages7
    JournalPhysical Review B
    Volume40
    Issue number17
    DOIs
    Publication statusPublished - 1989

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