Temperature Dependent FMR on CoCr Layers

E.M.C.M. Reuvekamp; A.M. de Witte; W.A.M. Aarnink; G.J. Gerritsma; J.C. Lodder; H. Rogalla

doi:10.1016/0304-8853(90)90429-T

Temperature Dependent FMR on CoCr Layers

E.M.C.M. Reuvekamp, A.M. de Witte, W.A.M. Aarnink, G.J. Gerritsma, J.C. Lodder, H. Rogalla

Physics of Interfaces and Nanomaterials

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Abstract

Temperature dependent FMR measurements were performed on two series of rf sputtered films. The FMR measuring temperature could be varied between 77 and 300 K. There is indication of the existence of 2 CoCr phases in the film from ion-milled samples. The perpendicular anisotropy increased with both decreasing temperature and stress-relaxation by removing the substrate.

Original language	English
Pages (from-to)	57-58
Number of pages	2
Journal	Journal of magnetism and magnetic materials
Volume	83
Issue number	1-3
DOIs	https://doi.org/10.1016/0304-8853(90)90429-T
Publication status	Published - 1990
Event	3rd European Magnetic Materials and Applications Conference, EMMA 1989 - Rimini, Italy Duration: 6 Sept 1989 → 9 Sept 1989 Conference number: 3

Keywords

SMI-TST: From 2006 in EWI-TST
SMI-MAT: MATERIALS

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Reuvekamp1989temperatureFinal published version, 1.52 MB

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@article{12226b4a5e4841588a901dc85d4a4b1d,

title = "Temperature Dependent FMR on CoCr Layers",

abstract = "Temperature dependent FMR measurements were performed on two series of rf sputtered films. The FMR measuring temperature could be varied between 77 and 300 K. There is indication of the existence of 2 CoCr phases in the film from ion-milled samples. The perpendicular anisotropy increased with both decreasing temperature and stress-relaxation by removing the substrate.",

keywords = "SMI-TST: From 2006 in EWI-TST, SMI-MAT: MATERIALS",

author = "E.M.C.M. Reuvekamp and {de Witte}, A.M. and W.A.M. Aarnink and G.J. Gerritsma and J.C. Lodder and H. Rogalla",

year = "1990",

doi = "10.1016/0304-8853(90)90429-T",

language = "English",

volume = "83",

pages = "57--58",

journal = "Journal of magnetism and magnetic materials",

issn = "0304-8853",

publisher = "Elsevier",

number = "1-3",

note = "3rd European Magnetic Materials and Applications Conference, EMMA 1989, EMMA ; Conference date: 06-09-1989 Through 09-09-1989",

}

TY - JOUR

T1 - Temperature Dependent FMR on CoCr Layers

AU - Reuvekamp, E.M.C.M.

AU - de Witte, A.M.

AU - Aarnink, W.A.M.

AU - Gerritsma, G.J.

AU - Lodder, J.C.

AU - Rogalla, H.

N1 - Conference code: 3

PY - 1990

Y1 - 1990

N2 - Temperature dependent FMR measurements were performed on two series of rf sputtered films. The FMR measuring temperature could be varied between 77 and 300 K. There is indication of the existence of 2 CoCr phases in the film from ion-milled samples. The perpendicular anisotropy increased with both decreasing temperature and stress-relaxation by removing the substrate.

AB - Temperature dependent FMR measurements were performed on two series of rf sputtered films. The FMR measuring temperature could be varied between 77 and 300 K. There is indication of the existence of 2 CoCr phases in the film from ion-milled samples. The perpendicular anisotropy increased with both decreasing temperature and stress-relaxation by removing the substrate.

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-MAT: MATERIALS

U2 - 10.1016/0304-8853(90)90429-T

DO - 10.1016/0304-8853(90)90429-T

M3 - Article

SN - 0304-8853

VL - 83

SP - 57

EP - 58

JO - Journal of magnetism and magnetic materials

JF - Journal of magnetism and magnetic materials

IS - 1-3

T2 - 3rd European Magnetic Materials and Applications Conference, EMMA 1989

Y2 - 6 September 1989 through 9 September 1989

ER -

Temperature Dependent FMR on CoCr Layers

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