Temperature Dependent FMR on CoCr Layers

E.M.C.M. Reuvekamp, A.M. de Witte, W.A.M. Aarnink, G.J. Gerritsma, J.C. Lodder, H. Rogalla

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Abstract

Temperature dependent FMR measurements were performed on two series of rf sputtered films. The FMR measuring temperature could be varied between 77 and 300 K. There is indication of the existence of 2 CoCr phases in the film from ion-milled samples. The perpendicular anisotropy increased with both decreasing temperature and stress-relaxation by removing the substrate.
Original languageEnglish
Pages (from-to)57-58
Number of pages2
JournalJournal of magnetism and magnetic materials
Volume83
Issue number1-3
DOIs
Publication statusPublished - 1990
Event3rd European Magnetic Materials and Applications Conference, EMMA 1989 - Rimini, Italy
Duration: 6 Sep 19899 Sep 1989
Conference number: 3

Keywords

  • SMI-TST: From 2006 in EWI-TST
  • SMI-MAT: MATERIALS

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