Temperature-drift-immune wavelength meter based on an integrated micro-ring resonator

Caterina Taballione, Temitope Agbana, Gleb Vdovin, Marcel Hoekman, Lennart Wevers, Jeroen Kalkman, Michel Verhaegen, Peter J.M. van der Slot, Klaus-Jochen Boller

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

We present an integrated optical wavelength meter based on a Si3N4/SiO2 micro ring resonator (operating over a free spectral range of ≈ 2.6 nm) whose output response is immune to temperature changes. The wavelength meter readout is performed by a neural network and a non-linear optimization algorithm. This novel approach insures a high wavelength estimation precision (≈ 50 pm). We observe a long-term reproducibility of the wavelength meter response over a time interval of one week. We investigate the influence of the ambient temperature on the estimated wavelength. We observe an immunity of the displayed output wavelength to temperature changes of up to several degrees. The temperature-drift immunity appears to be caused by deviations from the theoretically expected (perfect) transmission function of a ring resonator, i.e., caused by deviations that are usually undesired in spectroscopic devices.
Original languageEnglish
Title of host publicationIntegrated Optics
Subtitle of host publicationPhysics and Simulations III
EditorsPavel Cheben, Jirí Ctyroký, Iñigo Molina-Fernández
Place of PublicationBellingham, WA
PublisherSPIE
Number of pages10
ISBN (Electronic)9781510609860
ISBN (Print)9781510609853
DOIs
Publication statusPublished - 24 Apr 2017
EventSPIE Optics + Optoelectronics 2017 - Clarion Congress Hotel, Prague, Czech Republic
Duration: 24 Apr 201727 Apr 2017

Conference

ConferenceSPIE Optics + Optoelectronics 2017
CountryCzech Republic
CityPrague
Period24/04/1727/04/17

Keywords

  • Micro ring resonators
  • Temperature immunity
  • Integrated wavelength meter
  • Silicon nitride
  • High-precision wavelength estimation method
  • Neural network

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