Temperature-drift-immune wavelength meter based on an integrated micro-ring resonator

Caterina  Taballione; Temitope Agbana; Gleb Vdovin; Marcel Hoekman; Lennart Wevers; Jeroen Kalkman; Michel Verhaegen; Peter J.M. van der Slot; Klaus-Jochen Boller

doi:10.1117/12.2265604

Temperature-drift-immune wavelength meter based on an integrated micro-ring resonator

Caterina Taballione, Temitope Agbana, Gleb Vdovin, Marcel Hoekman, Lennart Wevers, Jeroen Kalkman, Michel Verhaegen, Peter J.M. van der Slot, Klaus-Jochen Boller

Laser Physics & Nonlinear Optics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

19 Downloads (Pure)

Abstract

We present an integrated optical wavelength meter based on a Si3N4/SiO2 micro ring resonator (operating over a free spectral range of ≈ 2.6 nm) whose output response is immune to temperature changes. The wavelength meter readout is performed by a neural network and a non-linear optimization algorithm. This novel approach insures a high wavelength estimation precision (≈ 50 pm). We observe a long-term reproducibility of the wavelength meter response over a time interval of one week. We investigate the influence of the ambient temperature on the estimated wavelength. We observe an immunity of the displayed output wavelength to temperature changes of up to several degrees. The temperature-drift immunity appears to be caused by deviations from the theoretically expected (perfect) transmission function of a ring resonator, i.e., caused by deviations that are usually undesired in spectroscopic devices.

Original language	English
Title of host publication	Integrated Optics
Subtitle of host publication	Physics and Simulations III
Editors	Pavel Cheben, Jirí Ctyroký, Iñigo Molina-Fernández
Place of Publication	Bellingham, WA
Publisher	SPIE
Number of pages	10
ISBN (Electronic)	9781510609860
ISBN (Print)	9781510609853
DOIs	https://doi.org/10.1117/12.2265604
Publication status	Published - 24 Apr 2017
Event	SPIE Optics + Optoelectronics 2017 - Clarion Congress Hotel, Prague, Czech Republic Duration: 24 Apr 2017 → 27 Apr 2017

Conference

Conference	SPIE Optics + Optoelectronics 2017
Country/Territory	Czech Republic
City	Prague
Period	24/04/17 → 27/04/17

Keywords

Micro ring resonators
Temperature immunity
Integrated wavelength meter
Silicon nitride
High-precision wavelength estimation method
Neural network

Access to Document

10.1117/12.2265604

Cite this

Taballione, C., Agbana, T., Vdovin, G., Hoekman, M., Wevers, L., Kalkman, J., Verhaegen, M., van der Slot, P. J. M., & Boller, K.-J. (2017). Temperature-drift-immune wavelength meter based on an integrated micro-ring resonator. In P. Cheben, J. Ctyroký, & I. Molina-Fernández (Eds.), Integrated Optics: Physics and Simulations III Article 1024206 SPIE. https://doi.org/10.1117/12.2265604

@inproceedings{449484108907417a984e871195b842f3,

title = "Temperature-drift-immune wavelength meter based on an integrated micro-ring resonator",

abstract = "We present an integrated optical wavelength meter based on a Si3N4/SiO2 micro ring resonator (operating over a free spectral range of ≈ 2.6 nm) whose output response is immune to temperature changes. The wavelength meter readout is performed by a neural network and a non-linear optimization algorithm. This novel approach insures a high wavelength estimation precision (≈ 50 pm). We observe a long-term reproducibility of the wavelength meter response over a time interval of one week. We investigate the influence of the ambient temperature on the estimated wavelength. We observe an immunity of the displayed output wavelength to temperature changes of up to several degrees. The temperature-drift immunity appears to be caused by deviations from the theoretically expected (perfect) transmission function of a ring resonator, i.e., caused by deviations that are usually undesired in spectroscopic devices. ",

keywords = "Micro ring resonators, Temperature immunity, Integrated wavelength meter, Silicon nitride, High-precision wavelength estimation method, Neural network",

author = "Caterina Taballione and Temitope Agbana and Gleb Vdovin and Marcel Hoekman and Lennart Wevers and Jeroen Kalkman and Michel Verhaegen and {van der Slot}, {Peter J.M.} and Klaus-Jochen Boller",

year = "2017",

month = apr,

day = "24",

doi = "10.1117/12.2265604",

language = "English",

isbn = "9781510609853",

editor = "Pavel Cheben and Ctyrok{\'y}, {Jir{\'i} } and Molina-Fern{\'a}ndez, {I{\~n}igo }",

booktitle = "Integrated Optics",

publisher = "SPIE",

address = "United States",

note = "SPIE Optics + Optoelectronics 2017 ; Conference date: 24-04-2017 Through 27-04-2017",

}

Taballione, C, Agbana, T, Vdovin, G, Hoekman, M, Wevers, L, Kalkman, J, Verhaegen, M, van der Slot, PJM & Boller, K-J 2017, Temperature-drift-immune wavelength meter based on an integrated micro-ring resonator. in P Cheben, J Ctyroký & I Molina-Fernández (eds), Integrated Optics: Physics and Simulations III., 1024206, SPIE, Bellingham, WA, SPIE Optics + Optoelectronics 2017, Prague, Czech Republic, 24/04/17. https://doi.org/10.1117/12.2265604

Temperature-drift-immune wavelength meter based on an integrated micro-ring resonator. / Taballione, Caterina ; Agbana, Temitope; Vdovin, Gleb et al.
Integrated Optics: Physics and Simulations III. ed. / Pavel Cheben; Jirí Ctyroký; Iñigo Molina-Fernández. Bellingham, WA: SPIE, 2017. 1024206.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Temperature-drift-immune wavelength meter based on an integrated micro-ring resonator

AU - Taballione, Caterina

AU - Agbana, Temitope

AU - Vdovin, Gleb

AU - Hoekman, Marcel

AU - Wevers, Lennart

AU - Kalkman, Jeroen

AU - Verhaegen, Michel

AU - van der Slot, Peter J.M.

AU - Boller, Klaus-Jochen

PY - 2017/4/24

Y1 - 2017/4/24

N2 - We present an integrated optical wavelength meter based on a Si3N4/SiO2 micro ring resonator (operating over a free spectral range of ≈ 2.6 nm) whose output response is immune to temperature changes. The wavelength meter readout is performed by a neural network and a non-linear optimization algorithm. This novel approach insures a high wavelength estimation precision (≈ 50 pm). We observe a long-term reproducibility of the wavelength meter response over a time interval of one week. We investigate the influence of the ambient temperature on the estimated wavelength. We observe an immunity of the displayed output wavelength to temperature changes of up to several degrees. The temperature-drift immunity appears to be caused by deviations from the theoretically expected (perfect) transmission function of a ring resonator, i.e., caused by deviations that are usually undesired in spectroscopic devices.

AB - We present an integrated optical wavelength meter based on a Si3N4/SiO2 micro ring resonator (operating over a free spectral range of ≈ 2.6 nm) whose output response is immune to temperature changes. The wavelength meter readout is performed by a neural network and a non-linear optimization algorithm. This novel approach insures a high wavelength estimation precision (≈ 50 pm). We observe a long-term reproducibility of the wavelength meter response over a time interval of one week. We investigate the influence of the ambient temperature on the estimated wavelength. We observe an immunity of the displayed output wavelength to temperature changes of up to several degrees. The temperature-drift immunity appears to be caused by deviations from the theoretically expected (perfect) transmission function of a ring resonator, i.e., caused by deviations that are usually undesired in spectroscopic devices.

KW - Micro ring resonators

KW - Temperature immunity

KW - Integrated wavelength meter

KW - Silicon nitride

KW - High-precision wavelength estimation method

KW - Neural network

U2 - 10.1117/12.2265604

DO - 10.1117/12.2265604

M3 - Conference contribution

SN - 9781510609853

BT - Integrated Optics

A2 - Cheben, Pavel

A2 - Ctyroký, Jirí

A2 - Molina-Fernández, Iñigo

PB - SPIE

CY - Bellingham, WA

T2 - SPIE Optics + Optoelectronics 2017

Y2 - 24 April 2017 through 27 April 2017

ER -

Temperature-drift-immune wavelength meter based on an integrated micro-ring resonator

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