Test coverage estimation by explicit generation of faulty FSMs

W.T.M. Kars

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	the 7th IFIP WG 6.1 International workshop on protocol test systems
Place of Publication	Tokyo, Japan
Pages	323-330
Publication status	Published - 8 Nov 1994

Keywords

@inproceedings{3c87d4b15fa44c8aac61c5e612cce44e,

title = "Test coverage estimation by explicit generation of faulty FSMs",

keywords = "METIS-120035",

author = "W.T.M. Kars",

year = "1994",

month = nov,

day = "8",

language = "Undefined",

pages = "323--330",

booktitle = "the 7th IFIP WG 6.1 International workshop on protocol test systems",

}