Test coverage estimation by explicit generation of faulty FSMs

W.T.M. Kars

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationthe 7th IFIP WG 6.1 International workshop on protocol test systems
    Place of PublicationTokyo, Japan
    Pages323-330
    Publication statusPublished - 8 Nov 1994

    Keywords

    • METIS-120035

    Cite this

    Kars, W. T. M. (1994). Test coverage estimation by explicit generation of faulty FSMs. In the 7th IFIP WG 6.1 International workshop on protocol test systems (pp. 323-330). Tokyo, Japan.