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Test equating and parallel test form assembly

  • Willem J. van der Linden

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Original languageEnglish
    Title of host publicationPresentation at Ngee Ann Polytechnic
    Place of PublicationSingapore
    Pages-
    Publication statusPublished - 22 Nov 1999

    Keywords

    • METIS-137597

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