Test Generation for Mixed-Signal Circuits Using Testability Analysis

M. Stancic, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationDigest of European Test Workshop
    Place of PublicationCorfu, Greece
    Pages249-254
    Number of pages6
    Publication statusPublished - 26 May 2002

    Keywords

    • METIS-207628

    Cite this