Test Generation for Mixed-Signal Circuits Using Testability Analysis

M. Stancic, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Digest of European Test Workshop
Place of Publication	Corfu, Greece
Pages	249-254
Number of pages	6
Publication status	Published - 26 May 2002

Keywords

@inproceedings{fe8a5a74668c49cc9c08d5489bf63c75,

title = "Test Generation for Mixed-Signal Circuits Using Testability Analysis",

keywords = "METIS-207628",

author = "M. Stancic and Kerkhoff, {Hans G.}",

year = "2002",

month = may,

day = "26",

language = "Undefined",

isbn = "geen",

pages = "249--254",

booktitle = "Digest of European Test Workshop",

}