Test-Pattern Generation and Fault Coverage Determination of Embedded Cores

V. Zivkovic, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationIEEE European Test Workshop
    Place of PublicationConstance, Germany
    Pages3/7-3/8
    Number of pages2
    Publication statusPublished - 1 May 1999

    Keywords

    • METIS-113040

    Cite this

    Zivkovic, V., Tangelder, R. J. W. T., & Kerkhoff, H. G. (1999). Test-Pattern Generation and Fault Coverage Determination of Embedded Cores. In IEEE European Test Workshop (pp. 3/7-3/8). Constance, Germany.