Test-Pattern Generation and Fault Coverage Determination of Embedded Cores

V. Zivkovic, R.J.W.T. Tangelder, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Keywords

@inproceedings{edfc77fbddd64d7d9834ad9b8e30a0d1,

title = "Test-Pattern Generation and Fault Coverage Determination of Embedded Cores",

keywords = "METIS-113040",

author = "V. Zivkovic and R.J.W.T. Tangelder and Kerkhoff, {Hans G.}",

year = "1999",

month = may,

day = "1",

language = "Undefined",

pages = "3/7--3/8",

booktitle = "IEEE European Test Workshop",

}