Test-Pattern Generation and Fault Coverage Determination of Embedded Cores

V. Zivkovic, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Other contribution › Other research output

    Original languageUndefined
    Place of PublicationEnschede, The Netherlands
    Publication statusPublished - 19 Oct 1999

    Keywords

    • METIS-114810

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