Test pattern generation for delay faults

G. van Brakel

    Research output: ThesisPhD Thesis - Research UT, graduation UT

    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Wallinga, Hans, Supervisor
    • Kerkhoff, Hans Gerard, Advisor
    Award date12 Apr 1996
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-9009213-7
    Publication statusPublished - 12 Apr 1996

    Keywords

    • METIS-111474

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