Test pattern generation for delay faults

G. van Brakel, Y. Xing, Hans G. Kerkhoff

Research output: Contribution to conference › Poster › Other research output

Original language	Undefined
Pages	-
Publication status	Published - 19 Nov 1991
Event	IOP/FOM Werkgemeenschap Halfgeleiders 1991 - Veldhoven, Netherlands Duration: 19 Nov 1991 → 20 Nov 1991

Conference	IOP/FOM Werkgemeenschap Halfgeleiders 1991
Country/Territory	Netherlands
City	Veldhoven
Period	19/11/91 → 20/11/91

Keywords

@conference{2d3a6667da8a42afa0d9425d79e8ffee,

title = "Test pattern generation for delay faults",

keywords = "METIS-117328",

author = "\{van Brakel\}, G. and Y. Xing and Kerkhoff, \{Hans G.\}",

year = "1991",

month = nov,

day = "19",

language = "Undefined",

pages = "--",

note = "IOP/FOM Werkgemeenschap Halfgeleiders 1991 ; Conference date: 19-11-1991 Through 20-11-1991",

}