Test-Quality Comparison between Full-Scan, Partial-Scan and On-Line Techniques for a Periodic Synchronizer

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of ProRISC
    Place of PublicationVeldhoven, the Netherlands
    Pages550-554
    Number of pages5
    Publication statusPublished - 29 Nov 2001
    Event14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003 - Veldhoven, Netherlands
    Duration: 25 Nov 200327 Nov 2003
    Conference number: 14

    Workshop

    Workshop14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003
    Abbreviated titleProRISC
    CountryNetherlands
    CityVeldhoven
    Period25/11/0327/11/03

    Keywords

    • METIS-201876

    Cite this

    Petre, O., & Kerkhoff, H. G. (2001). Test-Quality Comparison between Full-Scan, Partial-Scan and On-Line Techniques for a Periodic Synchronizer. In Proceedings of ProRISC (pp. 550-554). Veldhoven, the Netherlands.