Test regions using two or more correlated product characteristics

Willem/Wim Albers, G.R.J. Arts, W.C.M. Kallenberg

    • 2 Citations

    Abstract

    For inspection of manufactured parts, it may be much easier and/or cheaper to use the information from two or more product characteristics which are strongly related to the characteristic of interest, than to measure this characteristic itself. To get high quality output, it is required that from the accepted parts only a given, typically very small, fraction is nonconforming. In this paper test regions are determined such that, under the preceding condition, the number of accepted products is maximized. The good performance of the methods is illustrated by Monte Carlo results. An application in semiconductor industry shows its value in practice.
    Original languageUndefined
    Pages (from-to)153-165
    Number of pages13
    JournalTechnometrics
    Volume41
    Issue number2
    StatePublished - 1999

    Fingerprint

    Inspection
    Semiconductor materials
    Industry

    Keywords

    • inspection
    • EWI-13170
    • Simulations
    • Yield
    • Consumer risk

    Cite this

    Albers, W. W., Arts, G. R. J., & Kallenberg, W. C. M. (1999). Test regions using two or more correlated product characteristics. Technometrics, 41(2), 153-165.

    Albers, Willem/Wim; Arts, G.R.J.; Kallenberg, W.C.M. / Test regions using two or more correlated product characteristics.

    In: Technometrics, Vol. 41, No. 2, 1999, p. 153-165.

    Research output: Scientific - peer-reviewArticle

    @article{bcfc074baa7947aa9529bee2d1b763f9,
    title = "Test regions using two or more correlated product characteristics",
    abstract = "For inspection of manufactured parts, it may be much easier and/or cheaper to use the information from two or more product characteristics which are strongly related to the characteristic of interest, than to measure this characteristic itself. To get high quality output, it is required that from the accepted parts only a given, typically very small, fraction is nonconforming. In this paper test regions are determined such that, under the preceding condition, the number of accepted products is maximized. The good performance of the methods is illustrated by Monte Carlo results. An application in semiconductor industry shows its value in practice.",
    keywords = "inspection, EWI-13170, Simulations, Yield, Consumer risk",
    author = "Willem/Wim Albers and G.R.J. Arts and W.C.M. Kallenberg",
    year = "1999",
    volume = "41",
    pages = "153--165",
    journal = "Technometrics",
    issn = "0040-1706",
    publisher = "Taylor & Francis",
    number = "2",

    }

    Albers, WW, Arts, GRJ & Kallenberg, WCM 1999, 'Test regions using two or more correlated product characteristics' Technometrics, vol 41, no. 2, pp. 153-165.

    Test regions using two or more correlated product characteristics. / Albers, Willem/Wim; Arts, G.R.J.; Kallenberg, W.C.M.

    In: Technometrics, Vol. 41, No. 2, 1999, p. 153-165.

    Research output: Scientific - peer-reviewArticle

    TY - JOUR

    T1 - Test regions using two or more correlated product characteristics

    AU - Albers,Willem/Wim

    AU - Arts,G.R.J.

    AU - Kallenberg,W.C.M.

    PY - 1999

    Y1 - 1999

    N2 - For inspection of manufactured parts, it may be much easier and/or cheaper to use the information from two or more product characteristics which are strongly related to the characteristic of interest, than to measure this characteristic itself. To get high quality output, it is required that from the accepted parts only a given, typically very small, fraction is nonconforming. In this paper test regions are determined such that, under the preceding condition, the number of accepted products is maximized. The good performance of the methods is illustrated by Monte Carlo results. An application in semiconductor industry shows its value in practice.

    AB - For inspection of manufactured parts, it may be much easier and/or cheaper to use the information from two or more product characteristics which are strongly related to the characteristic of interest, than to measure this characteristic itself. To get high quality output, it is required that from the accepted parts only a given, typically very small, fraction is nonconforming. In this paper test regions are determined such that, under the preceding condition, the number of accepted products is maximized. The good performance of the methods is illustrated by Monte Carlo results. An application in semiconductor industry shows its value in practice.

    KW - inspection

    KW - EWI-13170

    KW - Simulations

    KW - Yield

    KW - Consumer risk

    M3 - Article

    VL - 41

    SP - 153

    EP - 165

    JO - Technometrics

    T2 - Technometrics

    JF - Technometrics

    SN - 0040-1706

    IS - 2

    ER -

    Albers WW, Arts GRJ, Kallenberg WCM. Test regions using two or more correlated product characteristics. Technometrics. 1999;41(2):153-165.