Test Signal Back Tracing for Testing Embedded Analogue Cores in SoC

L. Fang, Marcel H.H. Weusthof, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of IEEE 9th International Mixed-Signal Testing Workshop IMSTW 2003
Place of Publication	Seville, Spain
Pages	277-282
Number of pages	6
Publication status	Published - 1 Jun 2003

Keywords

@inproceedings{6d22a9961dce43e3bc87066c65cdbac8,

title = "Test Signal Back Tracing for Testing Embedded Analogue Cores in SoC",

keywords = "METIS-214880",

author = "L. Fang and Weusthof, {Marcel H.H.} and Kerkhoff, {Hans G.}",

year = "2003",

month = jun,

day = "1",

language = "Undefined",

pages = "277--282",

booktitle = "Proceedings of IEEE 9th International Mixed-Signal Testing Workshop IMSTW 2003",

}