Test Signal Back Tracing for Testing Embedded Analogue Cores in SoC

L. Fang, Marcel H.H. Weusthof, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    13 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of IEEE 9th International Mixed-Signal Testing Workshop IMSTW 2003
    Place of PublicationSeville, Spain
    Number of pages6
    Publication statusPublished - 1 Jun 2003


    • METIS-214880

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