Test Signal Back Tracing for Testing Embedded Analogue Cores in SoC

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    12 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of IEEE 9th International Mixed-Signal Testing Workshop IMSTW 2003
    Place of PublicationSeville, Spain
    Pages277-282
    Number of pages6
    Publication statusPublished - 1 Jun 2003

    Keywords

    • METIS-214880

    Cite this

    Fang, L., Weusthof, M. H. H., & Kerkhoff, H. G. (2003). Test Signal Back Tracing for Testing Embedded Analogue Cores in SoC. In Proceedings of IEEE 9th International Mixed-Signal Testing Workshop IMSTW 2003 (pp. 277-282). Seville, Spain.