Test Signal Back Tracing for Testing Embedded Analogue Cores in SoC

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    12 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of IEEE 9th International Mixed-Signal Testing Workshop IMSTW 2003
    Place of PublicationSeville, Spain
    Number of pages6
    Publication statusPublished - 1 Jun 2003


    • METIS-214880

    Cite this