Test signal backtrace in mixed-signal SoC testing

L. Fang, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceeding ProRISC workshop
Place of Publication	Veldhoven, The Netherlands
Pages	276-282
Number of pages	7
Publication status	Published - 29 Nov 2002

Keywords

@inproceedings{610cf3d776a8474894619b21b072b234,

title = "Test signal backtrace in mixed-signal SoC testing",

keywords = "METIS-207633",

author = "L. Fang and Kerkhoff, {Hans G.}",

year = "2002",

month = nov,

day = "29",

language = "Undefined",

isbn = "90-73461-33-2",

pages = "276--282",

booktitle = "Proceeding ProRISC workshop",

}