Test signal backtrace in mixed-signal SoC testing

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceeding ProRISC workshop
    Place of PublicationVeldhoven, The Netherlands
    Pages276-282
    Number of pages7
    Publication statusPublished - 29 Nov 2002

    Keywords

    • METIS-207633

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