Test-Signal Search for Mixed-Signal Cores in a System-on-Chip

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    Abstract

    The well-known approach towards testing mixed-signal cores is functional testing and basically measuring key parameters of the core. However, especially if performance requirements increase, and embedded cores are considered, functional testing becomes technically and economically less attractive. A more cost-effective approach could be accomplished by a combination of reduced functional tests and added structural tests. In addition, it will also improve the debugging facilities of cores. Basic problem remains the large computational effort for analogue structural testing. In this paper, we introduce the concept of Testability Transfer Function for both analogue as well as digital parts in a mixed-signal core. This opens new possibilities for efficient structural testing of embedded mixed-signal cores, thereby adding to the quality of tests.
    Original languageUndefined
    Pages536-541
    Publication statusPublished - 2004
    Event15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 - Veldhoven, Netherlands
    Duration: 25 Nov 200426 Nov 2004
    Conference number: 15

    Conference

    Conference15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004
    Abbreviated titleProRisc
    CountryNetherlands
    CityVeldhoven
    Period25/11/0426/11/04

    Keywords

    • IR-59504

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