Test-Signal Search for Mixed-Signal Cores in a System-on-Chip

Research output: Contribution to conferencePaperAcademic

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Abstract

The well-known approach towards testing mixed-signal cores is functional testing and basically measuring key parameters of the core. However, especially if performance requirements increase, and embedded cores are considered, functional testing becomes technically and economically less attractive. A more cost-effective approach could be accomplished by a combination of reduced functional tests and added structural tests. In addition, it will also improve the debugging facilities of cores. Basic problem remains the large computational effort for analogue structural testing. In this paper, we introduce the concept of Testability Transfer Function for both analogue as well as digital parts in a mixed-signal core. This opens new possibilities for efficient structural testing of embedded mixed-signal cores, thereby adding to the quality of tests.
Original languageUndefined
Pages536-541
Publication statusPublished - 2004
Event15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004 - Veldhoven, Netherlands
Duration: 25 Nov 200426 Nov 2004
Conference number: 15

Conference

Conference15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004
Abbreviated titleProRisc
CountryNetherlands
CityVeldhoven
Period25/11/0426/11/04

Keywords

  • IR-59504

Cite this

Kerkhoff, H. G. (2004). Test-Signal Search for Mixed-Signal Cores in a System-on-Chip. 536-541. Paper presented at 15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004, Veldhoven, Netherlands.
Kerkhoff, Hans G. / Test-Signal Search for Mixed-Signal Cores in a System-on-Chip. Paper presented at 15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004, Veldhoven, Netherlands.
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Kerkhoff, HG 2004, 'Test-Signal Search for Mixed-Signal Cores in a System-on-Chip' Paper presented at 15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004, Veldhoven, Netherlands, 25/11/04 - 26/11/04, pp. 536-541.

Test-Signal Search for Mixed-Signal Cores in a System-on-Chip. / Kerkhoff, Hans G.

2004. 536-541 Paper presented at 15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004, Veldhoven, Netherlands.

Research output: Contribution to conferencePaperAcademic

TY - CONF

T1 - Test-Signal Search for Mixed-Signal Cores in a System-on-Chip

AU - Kerkhoff, Hans G.

PY - 2004

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N2 - The well-known approach towards testing mixed-signal cores is functional testing and basically measuring key parameters of the core. However, especially if performance requirements increase, and embedded cores are considered, functional testing becomes technically and economically less attractive. A more cost-effective approach could be accomplished by a combination of reduced functional tests and added structural tests. In addition, it will also improve the debugging facilities of cores. Basic problem remains the large computational effort for analogue structural testing. In this paper, we introduce the concept of Testability Transfer Function for both analogue as well as digital parts in a mixed-signal core. This opens new possibilities for efficient structural testing of embedded mixed-signal cores, thereby adding to the quality of tests.

AB - The well-known approach towards testing mixed-signal cores is functional testing and basically measuring key parameters of the core. However, especially if performance requirements increase, and embedded cores are considered, functional testing becomes technically and economically less attractive. A more cost-effective approach could be accomplished by a combination of reduced functional tests and added structural tests. In addition, it will also improve the debugging facilities of cores. Basic problem remains the large computational effort for analogue structural testing. In this paper, we introduce the concept of Testability Transfer Function for both analogue as well as digital parts in a mixed-signal core. This opens new possibilities for efficient structural testing of embedded mixed-signal cores, thereby adding to the quality of tests.

KW - IR-59504

M3 - Paper

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EP - 541

ER -

Kerkhoff HG. Test-Signal Search for Mixed-Signal Cores in a System-on-Chip. 2004. Paper presented at 15th Annual Workshop on Circuits, Systems and Signal Processing, ProRisc 2004, Veldhoven, Netherlands.