Test Structures and their Application in Structural Testing of Digital RSFQ Circuits

A.J. Arun; Sander Heuvelmans; G.J. Gerritsma; Hans G. Kerkhoff

doi:10.1016/j.physc.2003.12.001

Test Structures and their Application in Structural Testing of Digital RSFQ Circuits

A.J. Arun, Sander Heuvelmans, G.J. Gerritsma, Hans G. Kerkhoff

Research output: Contribution to journal › Article › Academic › peer-review

5 Citations (Scopus)

5 Downloads (Pure)

Abstract

As the niobium (Nb) LTS RSFQ processes advance being the technology for future ultrahigh-speed systems in the digital domain, the quality of the process should be maintained high for a successful realization of these complex circuits. A defect-oriented testing (DOT) approach is essential so as to increase the yield of the process. Little information is available in this area and the recent increase of Josephson junctions to around 90,000 per chip requires a detailed study on this topic. In this paper we present how DOT can be applied to RSFQ circuits. As a result of a study conducted on an RSFQ process, a list of possible defects has been identified and described in detail. We have also developed test-structures for detection of the top-ranking defects, which will be used for the probability distribution of faults in the process. One of the highly probable defects will be used to elaborate the DOT technique for fault modeling and simulation purposes.

Original language	Undefined
Pages (from-to)	103-111
Number of pages	9
Journal	Physica C
Volume	Mar 2004
Issue number	1-2
DOIs	https://doi.org/10.1016/j.physc.2003.12.001
Publication status	Published - 2004

Keywords

Defect-oriented testing
IR-75656
Fault modeling
Superconductor devices
Structural testing
RSFQ circuit testing
METIS-218923

Access to Document

10.1016/j.physc.2003.12.001

Cite this

@article{b1cb8e350c6a4751a5076732dcc5fda5,

title = "Test Structures and their Application in Structural Testing of Digital RSFQ Circuits",

abstract = "As the niobium (Nb) LTS RSFQ processes advance being the technology for future ultrahigh-speed systems in the digital domain, the quality of the process should be maintained high for a successful realization of these complex circuits. A defect-oriented testing (DOT) approach is essential so as to increase the yield of the process. Little information is available in this area and the recent increase of Josephson junctions to around 90,000 per chip requires a detailed study on this topic. In this paper we present how DOT can be applied to RSFQ circuits. As a result of a study conducted on an RSFQ process, a list of possible defects has been identified and described in detail. We have also developed test-structures for detection of the top-ranking defects, which will be used for the probability distribution of faults in the process. One of the highly probable defects will be used to elaborate the DOT technique for fault modeling and simulation purposes.",

keywords = "Defect-oriented testing, IR-75656, Fault modeling, Superconductor devices, Structural testing, RSFQ circuit testing, METIS-218923",

author = "A.J. Arun and Sander Heuvelmans and G.J. Gerritsma and Kerkhoff, {Hans G.}",

year = "2004",

doi = "10.1016/j.physc.2003.12.001",

language = "Undefined",

volume = "Mar 2004",

pages = "103--111",

journal = "Physica C",

issn = "0921-4534",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Test Structures and their Application in Structural Testing of Digital RSFQ Circuits

AU - Arun, A.J.

AU - Heuvelmans, Sander

AU - Gerritsma, G.J.

AU - Kerkhoff, Hans G.

PY - 2004

Y1 - 2004

N2 - As the niobium (Nb) LTS RSFQ processes advance being the technology for future ultrahigh-speed systems in the digital domain, the quality of the process should be maintained high for a successful realization of these complex circuits. A defect-oriented testing (DOT) approach is essential so as to increase the yield of the process. Little information is available in this area and the recent increase of Josephson junctions to around 90,000 per chip requires a detailed study on this topic. In this paper we present how DOT can be applied to RSFQ circuits. As a result of a study conducted on an RSFQ process, a list of possible defects has been identified and described in detail. We have also developed test-structures for detection of the top-ranking defects, which will be used for the probability distribution of faults in the process. One of the highly probable defects will be used to elaborate the DOT technique for fault modeling and simulation purposes.

AB - As the niobium (Nb) LTS RSFQ processes advance being the technology for future ultrahigh-speed systems in the digital domain, the quality of the process should be maintained high for a successful realization of these complex circuits. A defect-oriented testing (DOT) approach is essential so as to increase the yield of the process. Little information is available in this area and the recent increase of Josephson junctions to around 90,000 per chip requires a detailed study on this topic. In this paper we present how DOT can be applied to RSFQ circuits. As a result of a study conducted on an RSFQ process, a list of possible defects has been identified and described in detail. We have also developed test-structures for detection of the top-ranking defects, which will be used for the probability distribution of faults in the process. One of the highly probable defects will be used to elaborate the DOT technique for fault modeling and simulation purposes.

KW - Defect-oriented testing

KW - IR-75656

KW - Fault modeling

KW - Superconductor devices

KW - Structural testing

KW - RSFQ circuit testing

KW - METIS-218923

U2 - 10.1016/j.physc.2003.12.001

DO - 10.1016/j.physc.2003.12.001

M3 - Article

SN - 0921-4534

VL - Mar 2004

SP - 103

EP - 111

JO - Physica C

JF - Physica C

IS - 1-2

ER -