Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

L.K. Nanver, X. Liu, Tihomir Knezevic

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

8 Citations (Scopus)

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Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon
Nanver, L. K. (Speaker), Liu, X. (Contributor) & Knezevic, T. (Contributor)
20 Mar 2018
Activity: Talk or presentation › Oral presentation

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