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Testability-Analysis Driven Test-Generation of Analogue Cores

  • M. Stancic
  • , Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 8th IEEE International Mixed Signal Test Workshop (IMSTW)
    Place of PublicationMontreux, Switzerland
    Pages103-108
    Publication statusPublished - 18 Jun 2002

    Keywords

    • METIS-207629

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