Abstract
A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.
Original language | Undefined |
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Pages (from-to) | 913-917 |
Number of pages | 5 |
Journal | Microelectronics journal |
Volume | 34 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2003 |
Keywords
- Testability
- Observability
- Controllability
- IR-75196
- METIS-215130