Testability-Analysis Drivens Test-Generation of Analogue Cores

M. Stancic, Hans G. Kerkhoff

    Research output: Contribution to journalArticleAcademicpeer-review

    3 Citations (Scopus)


    A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.
    Original languageUndefined
    Pages (from-to)913-917
    Number of pages5
    JournalMicroelectronics journal
    Issue number10
    Publication statusPublished - 2003


    • Testability
    • Observability
    • Controllability
    • IR-75196
    • METIS-215130

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