Testability-Analysis Drivens Test-Generation of Analogue Cores

M. Stancic; Hans G. Kerkhoff

doi:10.1016/S0026-2692(03)00159-9

Testability-Analysis Drivens Test-Generation of Analogue Cores

M. Stancic, Hans G. Kerkhoff

Research output: Contribution to journal › Article › Academic › peer-review

3 Citations (Scopus)

Abstract

A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.

Original language	Undefined
Pages (from-to)	913-917
Number of pages	5
Journal	Microelectronics journal
Volume	34
Issue number	10
DOIs	https://doi.org/10.1016/S0026-2692(03)00159-9
Publication status	Published - 2003

Keywords

Testability
Observability
Controllability
IR-75196
METIS-215130

Access to Document

10.1016/S0026-2692(03)00159-9

Cite this

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abstract = "A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.",

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AB - A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.

KW - Testability

KW - Observability

KW - Controllability

KW - IR-75196

KW - METIS-215130

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DO - 10.1016/S0026-2692(03)00159-9

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JO - Microelectronics

JF - Microelectronics

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