Testability-Analysis Drivens Test-Generation of Analogue Cores

M. Stancic; H.G. Kerkhoff

doi:10.1016/S0026-2692(03)00159-9

Testability-Analysis Drivens Test-Generation of Analogue Cores

M. Stancic, H.G. Kerkhoff

Research output: Contribution to journal › Article › Academic › peer-review

3 Citations (Scopus)

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Abstract

A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.

Original language	English
Pages (from-to)	913-917
Number of pages	5
Journal	Microelectronics journal
Volume	34
Issue number	10
DOIs	https://doi.org/10.1016/S0026-2692(03)00159-9
Publication status	Published - 2003

Keywords

Testability
Observability
Controllability

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10.1016/S0026-2692(03)00159-9

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title = "Testability-Analysis Drivens Test-Generation of Analogue Cores",

abstract = "A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.",

keywords = "Testability, Observability, Controllability",

author = "M. Stancic and H.G. Kerkhoff",

year = "2003",

doi = "10.1016/S0026-2692(03)00159-9",

language = "English",

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T1 - Testability-Analysis Drivens Test-Generation of Analogue Cores

AU - Stancic, M.

AU - Kerkhoff, H.G.

PY - 2003

Y1 - 2003

N2 - A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.

AB - A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.

KW - Testability

KW - Observability

KW - Controllability

U2 - 10.1016/S0026-2692(03)00159-9

DO - 10.1016/S0026-2692(03)00159-9

M3 - Article

SN - 0026-2692

VL - 34

SP - 913

EP - 917

JO - Microelectronics journal

JF - Microelectronics journal

IS - 10

ER -

Testability-Analysis Drivens Test-Generation of Analogue Cores

Abstract

Keywords

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