In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC.
|Title of host publication||Proceedings of IEEE 11th International Mixed Signal Test Workshop|
|Place of Publication||France|
|Number of pages||6|
|ISBN (Print)||not assigned|
|Publication status||Published - 27 Jun 2005|