Testability Analysis for true Mixed-Signal Integrated Circuits

A. van de Kraats; Hans G. Kerkhoff

Testability Analysis for true Mixed-Signal Integrated Circuits

A. van de Kraats, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC.

Original language	Undefined
Title of host publication	Proceedings of IEEE 11th International Mixed Signal Test Workshop
Place of Publication	France
Publisher	TIMA Laboratory
Pages	1-6
Number of pages	6
ISBN (Print)	not assigned
Publication status	Published - 27 Jun 2005
Event	Proceedings of IEEE 11th International Mixed Signal Test Workshop - Cannes, France Duration: 27 Jun 2005 → 29 Jun 2005

Publication series

Name
Publisher	TIMA Laboratory

Conference

Conference	Proceedings of IEEE 11th International Mixed Signal Test Workshop
Period	27/06/05 → 29/06/05
Other	27-29 June 2005

Keywords

EWI-19986
METIS-226932
IR-76703

Access to Document

http://eprints.eemcs.utwente.nl/secure2/19986/01/19986_Testability_Analysis_for_True_Mixed-Signal_Integrated_Circuits.pdf

Cite this

@inproceedings{c7c147b6b84f4703b24549544dede284,

title = "Testability Analysis for true Mixed-Signal Integrated Circuits",

abstract = "In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC.",

keywords = "EWI-19986, METIS-226932, IR-76703",

author = "{van de Kraats}, A. and Kerkhoff, {Hans G.}",

note = "sponsored by IEEE Computer Society, Test Technology Technical Council (TTTC) and TIMA Laboratory; Proceedings of IEEE 11th International Mixed Signal Test Workshop ; Conference date: 27-06-2005 Through 29-06-2005",

year = "2005",

month = jun,

day = "27",

language = "Undefined",

isbn = "not assigned",

publisher = "TIMA Laboratory",

pages = "1--6",

booktitle = "Proceedings of IEEE 11th International Mixed Signal Test Workshop",

}

van de Kraats, A & Kerkhoff, HG 2005, Testability Analysis for true Mixed-Signal Integrated Circuits. in Proceedings of IEEE 11th International Mixed Signal Test Workshop. TIMA Laboratory, France, pp. 1-6, Proceedings of IEEE 11th International Mixed Signal Test Workshop, 27/06/05. <http://eprints.eemcs.utwente.nl/secure2/19986/01/19986_Testability_Analysis_for_True_Mixed-Signal_Integrated_Circuits.pdf>

TY - GEN

T1 - Testability Analysis for true Mixed-Signal Integrated Circuits

AU - van de Kraats, A.

AU - Kerkhoff, Hans G.

N1 - sponsored by IEEE Computer Society, Test Technology Technical Council (TTTC) and TIMA Laboratory

PY - 2005/6/27

Y1 - 2005/6/27

N2 - In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC.

AB - In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC.

KW - EWI-19986

KW - METIS-226932

KW - IR-76703

M3 - Conference contribution

SN - not assigned

SP - 1

EP - 6

BT - Proceedings of IEEE 11th International Mixed Signal Test Workshop

PB - TIMA Laboratory

CY - France

T2 - Proceedings of IEEE 11th International Mixed Signal Test Workshop

Y2 - 27 June 2005 through 29 June 2005

ER -