Testability Analysis for true Mixed-Signal Integrated Circuits

A. van de Kraats, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review


    In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC.
    Original languageUndefined
    Title of host publicationProceedings of IEEE 11th International Mixed Signal Test Workshop
    Place of PublicationFrance
    PublisherTIMA Laboratory
    Number of pages6
    ISBN (Print)not assigned
    Publication statusPublished - 27 Jun 2005
    EventProceedings of IEEE 11th International Mixed Signal Test Workshop - Cannes, France
    Duration: 27 Jun 200529 Jun 2005

    Publication series

    PublisherTIMA Laboratory


    ConferenceProceedings of IEEE 11th International Mixed Signal Test Workshop
    Other27-29 June 2005


    • EWI-19986
    • METIS-226932
    • IR-76703

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