Abstract
| Original language | Undefined |
|---|---|
| Pages (from-to) | 573-583 |
| Number of pages | 11 |
| Journal | IEEE transactions on computer-aided design of integrated circuits and systems |
| Volume | 9 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1990 |
Keywords
- METIS-112024
- IR-15150
Cite this
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Testability analysis of analog systems. / Hemink, Gertjan; Hemink, Gertjan J.; Meijer, Berend W.; Kerkhoff, Hans G.
In: IEEE transactions on computer-aided design of integrated circuits and systems, Vol. 9, No. 6, 1990, p. 573-583.Research output: Contribution to journal › Article › Academic › peer-review
TY - JOUR
T1 - Testability analysis of analog systems
AU - Hemink, Gertjan
AU - Hemink, Gertjan J.
AU - Meijer, Berend W.
AU - Kerkhoff, Hans G.
PY - 1990
Y1 - 1990
N2 - A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present
AB - A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present
KW - METIS-112024
KW - IR-15150
U2 - 10.1109/43.55186
DO - 10.1109/43.55186
M3 - Article
VL - 9
SP - 573
EP - 583
JO - IEEE transactions on computer-aided design of integrated circuits and systems
JF - IEEE transactions on computer-aided design of integrated circuits and systems
SN - 0278-0070
IS - 6
ER -