Testability analysis of analog systems

Gertjan Hemink; Gertjan J. Hemink; Berend W. Meijer; Hans G. Kerkhoff

doi:10.1109/43.55186

Testability analysis of analog systems

Gertjan Hemink, Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff

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Abstract

A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present

Original language	Undefined
Pages (from-to)	573-583
Number of pages	11
Journal	IEEE transactions on computer-aided design of integrated circuits and systems
Volume	9
Issue number	6
DOIs	https://doi.org/10.1109/43.55186
Publication status	Published - 1990

Keywords

METIS-112024
IR-15150

Access to Document

10.1109/43.55186

00055186
open

Cite this

Hemink, G., Hemink, G. J., Meijer, B. W., & Kerkhoff, H. G. (1990). Testability analysis of analog systems. IEEE transactions on computer-aided design of integrated circuits and systems, 9(6), 573-583. https://doi.org/10.1109/43.55186

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AU - Meijer, Berend W.

AU - Kerkhoff, Hans G.

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AB - A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present

KW - METIS-112024

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U2 - 10.1109/43.55186

DO - 10.1109/43.55186

M3 - Article

VL - 9

SP - 573

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JO - IEEE transactions on computer-aided design of integrated circuits and systems

JF - IEEE transactions on computer-aided design of integrated circuits and systems

SN - 0278-0070

IS - 6

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