Testability analysis of analog systems

Gertjan Hemink, Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff

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    A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present
    Original languageUndefined
    Pages (from-to)573-583
    Number of pages11
    JournalIEEE transactions on computer-aided design of integrated circuits and systems
    Issue number6
    Publication statusPublished - 1990


    • METIS-112024
    • IR-15150

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