Testability analysis of analog systems

Gertjan Hemink, Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present
Original languageUndefined
Pages (from-to)573-583
Number of pages11
JournalIEEE transactions on computer-aided design of integrated circuits and systems
Volume9
Issue number6
DOIs
Publication statusPublished - 1990

Keywords

  • METIS-112024
  • IR-15150

Cite this

Hemink, Gertjan ; Hemink, Gertjan J. ; Meijer, Berend W. ; Kerkhoff, Hans G. / Testability analysis of analog systems. In: IEEE transactions on computer-aided design of integrated circuits and systems. 1990 ; Vol. 9, No. 6. pp. 573-583.
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Testability analysis of analog systems. / Hemink, Gertjan; Hemink, Gertjan J.; Meijer, Berend W.; Kerkhoff, Hans G.

In: IEEE transactions on computer-aided design of integrated circuits and systems, Vol. 9, No. 6, 1990, p. 573-583.

Research output: Contribution to journalArticleAcademicpeer-review

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AU - Hemink, Gertjan

AU - Hemink, Gertjan J.

AU - Meijer, Berend W.

AU - Kerkhoff, Hans G.

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AB - A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present

KW - METIS-112024

KW - IR-15150

U2 - 10.1109/43.55186

DO - 10.1109/43.55186

M3 - Article

VL - 9

SP - 573

EP - 583

JO - IEEE transactions on computer-aided design of integrated circuits and systems

JF - IEEE transactions on computer-aided design of integrated circuits and systems

SN - 0278-0070

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ER -