Abstract
A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present
Original language | Undefined |
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Pages (from-to) | 573-583 |
Number of pages | 11 |
Journal | IEEE transactions on computer-aided design of integrated circuits and systems |
Volume | 9 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1990 |
Keywords
- METIS-112024
- IR-15150