Testability analysis of analog systems

Gertjan Hemink; Gertjan J. Hemink; Berend W. Meijer; Hans G. Kerkhoff

doi:10.1109/43.55186

Testability analysis of analog systems

Gertjan Hemink, Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff

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Abstract

A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present

Original language	Undefined
Pages (from-to)	573-583
Number of pages	11
Journal	IEEE transactions on computer-aided design of integrated circuits and systems
Volume	9
Issue number	6
DOIs	https://doi.org/10.1109/43.55186
Publication status	Published - 1990

Keywords

METIS-112024
IR-15150

Access to Document

10.1109/43.55186

00055186
open

Cite this

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title = "Testability analysis of analog systems",

abstract = "A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present",

keywords = "METIS-112024, IR-15150",

author = "Gertjan Hemink and Hemink, {Gertjan J.} and Meijer, {Berend W.} and Kerkhoff, {Hans G.}",

year = "1990",

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language = "Undefined",

volume = "9",

pages = "573--583",

journal = "IEEE transactions on computer-aided design of integrated circuits and systems",

issn = "0278-0070",

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TY - JOUR

T1 - Testability analysis of analog systems

AU - Hemink, Gertjan

AU - Hemink, Gertjan J.

AU - Meijer, Berend W.

AU - Kerkhoff, Hans G.

PY - 1990

Y1 - 1990

N2 - A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present

AB - A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present

KW - METIS-112024

KW - IR-15150

U2 - 10.1109/43.55186

DO - 10.1109/43.55186

M3 - Article

VL - 9

SP - 573

EP - 583

JO - IEEE transactions on computer-aided design of integrated circuits and systems

JF - IEEE transactions on computer-aided design of integrated circuits and systems

SN - 0278-0070

IS - 6

ER -