Testability Concepts for Digital ICs

F.P.M. Beenker

    Research output: ThesisPhD Thesis - Research UT, graduation externalAcademic

    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Wallinga, Hans, Supervisor
    • Krol, Th., Supervisor
    • Kerkhoff, Hans G., Advisor
    Award date14 Apr 1994
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-74445-11-X
    Publication statusPublished - 14 Apr 1994

    Keywords

    • METIS-111473

    Cite this

    Beenker, F. P. M. (1994). Testability Concepts for Digital ICs. Enschede: Universiteit Twente.
    Beenker, F.P.M.. / Testability Concepts for Digital ICs. Enschede : Universiteit Twente, 1994. 213 p.
    @phdthesis{86627ed8a72b421c92a5a7a802271bb2,
    title = "Testability Concepts for Digital ICs",
    keywords = "METIS-111473",
    author = "F.P.M. Beenker",
    year = "1994",
    month = "4",
    day = "14",
    language = "Undefined",
    isbn = "90-74445-11-X",
    publisher = "Universiteit Twente",
    school = "University of Twente",

    }

    Beenker, FPM 1994, 'Testability Concepts for Digital ICs', University of Twente, Enschede.

    Testability Concepts for Digital ICs. / Beenker, F.P.M.

    Enschede : Universiteit Twente, 1994. 213 p.

    Research output: ThesisPhD Thesis - Research UT, graduation externalAcademic

    TY - THES

    T1 - Testability Concepts for Digital ICs

    AU - Beenker, F.P.M.

    PY - 1994/4/14

    Y1 - 1994/4/14

    KW - METIS-111473

    M3 - PhD Thesis - Research UT, graduation external

    SN - 90-74445-11-X

    PB - Universiteit Twente

    CY - Enschede

    ER -

    Beenker FPM. Testability Concepts for Digital ICs. Enschede: Universiteit Twente, 1994. 213 p.