Testability issues in Superconductor Electronics

Hans G. Kerkhoff; Arun J. Arun

doi:10.1109/DELTA.2004.10043

Testability issues in Superconductor Electronics

Hans G. Kerkhoff, Arun J. Arun

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

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Abstract

An emerging technology for solutions in high-end applications in computing and telecommunication is superconductor electronics. A system-level study has been carried out to verify the feasibility of DfT in superconductor electronics. In this paper, we present how this can be realized to monitor so-called single-flux quantum pulses. As a part of our research, test structures have been developed to detect structural defects in this technology. We also show detailed test results of those structures. It proves that it is possible to detect possible random defects and provide defect statistics for the Niobium-based fabrication process.

Original language	English
Title of host publication	Proceedings IEEE DELTA 2004
Place of Publication	Piscataway, NJ
Publisher	IEEE
Number of pages	6
ISBN (Print)	9780769520810
DOIs	https://doi.org/10.1109/DELTA.2004.10043
Publication status	Published - 28 Jan 2004
Event	2nd IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2004 - Perth, Australia Duration: 28 Jan 2004 → 30 Jan 2004 Conference number: 2

Workshop

Workshop	2nd IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2004
Abbreviated title	DELTA
Country/Territory	Australia
City	Perth
Period	28/01/04 → 30/01/04

Keywords

IR-74028
METIS-218934

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10.1109/DELTA.2004.10043

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title = "Testability issues in Superconductor Electronics",

abstract = "An emerging technology for solutions in high-end applications in computing and telecommunication is superconductor electronics. A system-level study has been carried out to verify the feasibility of DfT in superconductor electronics. In this paper, we present how this can be realized to monitor so-called single-flux quantum pulses. As a part of our research, test structures have been developed to detect structural defects in this technology. We also show detailed test results of those structures. It proves that it is possible to detect possible random defects and provide defect statistics for the Niobium-based fabrication process.",

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AU - Arun, Arun J.

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N2 - An emerging technology for solutions in high-end applications in computing and telecommunication is superconductor electronics. A system-level study has been carried out to verify the feasibility of DfT in superconductor electronics. In this paper, we present how this can be realized to monitor so-called single-flux quantum pulses. As a part of our research, test structures have been developed to detect structural defects in this technology. We also show detailed test results of those structures. It proves that it is possible to detect possible random defects and provide defect statistics for the Niobium-based fabrication process.

AB - An emerging technology for solutions in high-end applications in computing and telecommunication is superconductor electronics. A system-level study has been carried out to verify the feasibility of DfT in superconductor electronics. In this paper, we present how this can be realized to monitor so-called single-flux quantum pulses. As a part of our research, test structures have been developed to detect structural defects in this technology. We also show detailed test results of those structures. It proves that it is possible to detect possible random defects and provide defect statistics for the Niobium-based fabrication process.

KW - IR-74028

KW - METIS-218934

U2 - 10.1109/DELTA.2004.10043

DO - 10.1109/DELTA.2004.10043

M3 - Conference contribution

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T2 - 2nd IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2004

Y2 - 28 January 2004 through 30 January 2004

ER -

Testability issues in Superconductor Electronics

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Keywords

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