Testability issues in Superconductor Electronics

Hans G. Kerkhoff, Arun J. Arun

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)
    4 Downloads (Pure)

    Abstract

    An emerging technology for solutions in high-end applications in computing and telecommunication is superconductor electronics. A system-level study has been carried out to verify the feasibility of DfT in superconductor electronics. In this paper, we present how this can be realized to monitor so-called single-flux quantum pulses. As a part of our research, test structures have been developed to detect structural defects in this technology. We also show detailed test results of those structures. It proves that it is possible to detect possible random defects and provide defect statistics for the Niobium-based fabrication process.
    Original languageEnglish
    Title of host publicationProceedings IEEE DELTA 2004
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Number of pages6
    ISBN (Print)9780769520810
    DOIs
    Publication statusPublished - 28 Jan 2004
    Event2nd IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2004 - Perth, Australia
    Duration: 28 Jan 200430 Jan 2004
    Conference number: 2

    Workshop

    Workshop2nd IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2004
    Abbreviated titleDELTA
    CountryAustralia
    CityPerth
    Period28/01/0430/01/04

    Keywords

    • IR-74028
    • METIS-218934

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