Testable Design and Test of Digital ICs

R.J.W.T. Tangelder, F.J. te Beest, O. Petre, V. Zivkovic, H.J. Vermaak, A.J. Arun

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationEnschede, The Netherlands
    Publication statusPublished - 12 Oct 2000

    Keywords

    • METIS-114802

    Cite this

    Tangelder, R. J. W. T., te Beest, F. J., Petre, O., Zivkovic, V., Vermaak, H. J., & Arun, A. J. (2000, Oct 12). Testable Design and Test of Digital ICs. Enschede, The Netherlands.