Testable Design and Test of Digital ICs

R.J.W.T. Tangelder, F.J. te Beest, O. Petre, V. Zivkovic, H.J. Vermaak, A.J. Arun

    Research output: Other contribution › Other research output

    Original languageUndefined
    Place of PublicationEnschede, The Netherlands
    Publication statusPublished - 12 Oct 2000

    Keywords

    • METIS-114802

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