Testable Design and Testing of High-Speed Superconductor Microelectronics

Hans G. Kerkhoff; A.J. Arun; Sander Heuvelmans

doi:10.1109/DELTA.2002.994580

Testable Design and Testing of High-Speed Superconductor Microelectronics

Hans G. Kerkhoff, A.J. Arun, Sander Heuvelmans

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

138 Downloads (Pure)

Abstract

True software-defined radio cellular base stations require extremely fast data converters, which can not currently be implemented in semiconductor technology. Superconductor niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and illustrates how BIST can be a solution of detecting defects in ADCs under extreme conditions.

Original language	Undefined
Title of host publication	Proceedings IEEE International Workshop on Electronic Design, Test and Applications (DELTA)
Publisher	IEEE
Pages	8-12
Number of pages	5
ISBN (Print)	0-7695-1453-7
DOIs	https://doi.org/10.1109/DELTA.2002.994580
Publication status	Published - 1 Jan 2002
Event	First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002 - Christchurch, New Zealand Duration: 29 Jan 2002 → 31 Jan 2002

Publication series

Name
Publisher	IEEE

Conference

Conference	First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002
Period	29/01/02 → 31/01/02
Other	29-31 Jan 2002

Keywords

IR-74029
METIS-208711

Access to Document

10.1109/DELTA.2002.994580

Kerkhoff02testable

Cite this

@inproceedings{a6e03848f508466c955fb51a5041a9a9,

title = "Testable Design and Testing of High-Speed Superconductor Microelectronics",

abstract = "True software-defined radio cellular base stations require extremely fast data converters, which can not currently be implemented in semiconductor technology. Superconductor niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and illustrates how BIST can be a solution of detecting defects in ADCs under extreme conditions.",

keywords = "IR-74029, METIS-208711",

author = "Kerkhoff, {Hans G.} and A.J. Arun and Sander Heuvelmans",

year = "2002",

month = jan,

day = "1",

doi = "10.1109/DELTA.2002.994580",

language = "Undefined",

isbn = "0-7695-1453-7",

publisher = "IEEE",

pages = "8--12",

booktitle = "Proceedings IEEE International Workshop on Electronic Design, Test and Applications (DELTA)",

address = "United States",

note = "First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002 ; Conference date: 29-01-2002 Through 31-01-2002",

}

Kerkhoff, HG, Arun, AJ & Heuvelmans, S 2002, Testable Design and Testing of High-Speed Superconductor Microelectronics. in Proceedings IEEE International Workshop on Electronic Design, Test and Applications (DELTA). IEEE, pp. 8-12, First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002, 29/01/02. https://doi.org/10.1109/DELTA.2002.994580

TY - GEN

T1 - Testable Design and Testing of High-Speed Superconductor Microelectronics

AU - Kerkhoff, Hans G.

AU - Arun, A.J.

AU - Heuvelmans, Sander

PY - 2002/1/1

Y1 - 2002/1/1

N2 - True software-defined radio cellular base stations require extremely fast data converters, which can not currently be implemented in semiconductor technology. Superconductor niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and illustrates how BIST can be a solution of detecting defects in ADCs under extreme conditions.

AB - True software-defined radio cellular base stations require extremely fast data converters, which can not currently be implemented in semiconductor technology. Superconductor niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and illustrates how BIST can be a solution of detecting defects in ADCs under extreme conditions.

KW - IR-74029

KW - METIS-208711

U2 - 10.1109/DELTA.2002.994580

DO - 10.1109/DELTA.2002.994580

M3 - Conference contribution

SN - 0-7695-1453-7

SP - 8

EP - 12

BT - Proceedings IEEE International Workshop on Electronic Design, Test and Applications (DELTA)

PB - IEEE

T2 - First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002

Y2 - 29 January 2002 through 31 January 2002

ER -