True software-defined radio cellular base stations require extremely fast data converters, which can not currently be implemented in semiconductor technology. Superconductor niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and illustrates how BIST can be a solution of detecting defects in ADCs under extreme conditions.
|Conference||First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002|
|Period||29/01/02 → 31/01/02|
|Other||29-31 Jan 2002 |