Testable Design and Testing of High-Speed Superconductor Microelectronics

Hans G. Kerkhoff, A.J. Arun, Sander Heuvelmans

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)
    63 Downloads (Pure)

    Abstract

    True software-defined radio cellular base stations require extremely fast data converters, which can not currently be implemented in semiconductor technology. Superconductor niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and illustrates how BIST can be a solution of detecting defects in ADCs under extreme conditions.
    Original languageUndefined
    Title of host publicationProceedings IEEE International Workshop on Electronic Design, Test and Applications (DELTA)
    PublisherIEEE
    Pages8-12
    Number of pages5
    ISBN (Print)0-7695-1453-7
    DOIs
    Publication statusPublished - 1 Jan 2002
    EventFirst IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002 - Christchurch, New Zealand
    Duration: 29 Jan 200231 Jan 2002

    Publication series

    Name
    PublisherIEEE

    Conference

    ConferenceFirst IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002
    Period29/01/0231/01/02
    Other29-31 Jan 2002

    Keywords

    • IR-74029
    • METIS-208711

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