Testable Design and Testing of Microsystems

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

    Abstract

    The low internal node accessibility of microsystems and the variety of components and technologies used in these system scan be considered as a real challenge for testing these devices. Although many concept scan be applied which have already been developed for testing boards and ICs, also new aspects like sensor/actuator testing have to be considered. The choice which of the many approaches is most adequate turns out to be very application dependent. Test approaches are shown for two microsystems.
    Original languageUndefined
    Title of host publicationDesign of Systems on a Chip
    EditorsRicardo Reis, Marcelo Lubaszewski, Jochen A.G. Jess
    Place of PublicationBerlin - Heidelberg - New York
    PublisherSpringer
    Pages203-219
    Number of pages17
    ISBN (Print)978-0-387-32499-9
    DOIs
    Publication statusPublished - 2006

    Publication series

    Name
    PublisherSpringer
    Number06EX1521

    Keywords

    • Design-for-Test - Testing - BIST - Test Busses - Boundary-Scan - Sensor/Actuator Testing - Microsystems - MCMs
    • IR-63654
    • METIS-237570
    • EWI-8047

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