The low internal node accessibility of microsystems and the variety of components and technologies used in these system scan be considered as a real challenge for testing these devices.
Although many concept scan be applied which have already been developed for testing boards and ICs, also new aspects like sensor/actuator testing have to be considered. The choice which of the many approaches is most adequate turns out to be very application dependent. Test approaches are shown for two microsystems.
|Title of host publication||Design of Systems on a Chip|
|Editors||Ricardo Reis, Marcelo Lubaszewski, Jochen A.G. Jess|
|Place of Publication||Berlin - Heidelberg - New York|
|Number of pages||17|
|Publication status||Published - 2006|
- Design-for-Test - Testing - BIST - Test Busses - Boundary-Scan - Sensor/Actuator Testing - Microsystems - MCMs