@inbook{0f5f3200261e454a85ac61feaef99ab7,
title = "Testable Design and Testing of Microsystems",
abstract = "The low internal node accessibility of microsystems and the variety of components and technologies used in these system scan be considered as a real challenge for testing these devices. Although many concept scan be applied which have already been developed for testing boards and ICs, also new aspects like sensor/actuator testing have to be considered. The choice which of the many approaches is most adequate turns out to be very application dependent. Test approaches are shown for two microsystems.",
keywords = "Design-for-Test - Testing - BIST - Test Busses - Boundary-Scan - Sensor/Actuator Testing - Microsystems - MCMs, IR-63654, METIS-237570, EWI-8047",
author = "Kerkhoff, {Hans G.}",
year = "2006",
doi = "10.1007/0-387-32500-X_10",
language = "Undefined",
isbn = "978-0-387-32499-9",
publisher = "Springer",
number = "06EX1521",
pages = "203--219",
editor = "Ricardo Reis and Marcelo Lubaszewski and Jess, {Jochen A.G.}",
booktitle = "Design of Systems on a Chip",
address = "Germany",
}