Testbaar ontwerpen en testen van gemengd analoog/digitale microsystemen

Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings themadag testen van elektronica
    Place of PublicationMicrocentrum, Eindhoven
    Pages3.1-3.19
    Publication statusPublished - 7 Nov 1995

    Keywords

    • METIS-112956

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