Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method

H.J. Vermaak, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationInf. Digest IEEE European Test Conference
    Place of PublicationCorfu, Greece
    Pages115-116
    Number of pages2
    Publication statusPublished - 27 May 2002

    Keywords

    • METIS-209323

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