Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method

H.J. Vermaak, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationInf. Digest IEEE European Test Conference
    Place of PublicationCorfu, Greece
    Pages115-116
    Number of pages2
    Publication statusPublished - 27 May 2002

    Keywords

    • METIS-209323

    Cite this

    Vermaak, H. J., & Kerkhoff, H. G. (2002). Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method. In Inf. Digest IEEE European Test Conference (pp. 115-116). Corfu, Greece.