Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method

H.J. Vermaak, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationInf. Digest IEEE European Test Conference
    Place of PublicationCorfu, Greece
    Pages115-116
    Number of pages2
    Publication statusPublished - 27 May 2002

    Keywords

    • METIS-209323

    Cite this

    Vermaak, H. J., & Kerkhoff, H. G. (2002). Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method. In Inf. Digest IEEE European Test Conference (pp. 115-116). Corfu, Greece.
    Vermaak, H.J. ; Kerkhoff, Hans G. / Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method. Inf. Digest IEEE European Test Conference. Corfu, Greece, 2002. pp. 115-116
    @inproceedings{033a47bd44cd40e2af6f676ad3d205a5,
    title = "Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method",
    keywords = "METIS-209323",
    author = "H.J. Vermaak and Kerkhoff, {Hans G.}",
    year = "2002",
    month = "5",
    day = "27",
    language = "Undefined",
    isbn = "geen",
    pages = "115--116",
    booktitle = "Inf. Digest IEEE European Test Conference",

    }

    Vermaak, HJ & Kerkhoff, HG 2002, Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method. in Inf. Digest IEEE European Test Conference. Corfu, Greece, pp. 115-116.

    Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method. / Vermaak, H.J.; Kerkhoff, Hans G.

    Inf. Digest IEEE European Test Conference. Corfu, Greece, 2002. p. 115-116.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method

    AU - Vermaak, H.J.

    AU - Kerkhoff, Hans G.

    PY - 2002/5/27

    Y1 - 2002/5/27

    KW - METIS-209323

    M3 - Conference contribution

    SN - geen

    SP - 115

    EP - 116

    BT - Inf. Digest IEEE European Test Conference

    CY - Corfu, Greece

    ER -

    Vermaak HJ, Kerkhoff HG. Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method. In Inf. Digest IEEE European Test Conference. Corfu, Greece. 2002. p. 115-116