Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method

H.J. Vermaak, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Inf. Digest IEEE European Test Conference
Place of Publication	Corfu, Greece
Pages	115-116
Number of pages	2
Publication status	Published - 27 May 2002

Keywords

@inproceedings{033a47bd44cd40e2af6f676ad3d205a5,

title = "Testing for Delay Faults using a Variable Supply Voltage in Combination with the Oscillation Test Method",

keywords = "METIS-209323",

author = "H.J. Vermaak and Kerkhoff, \{Hans G.\}",

year = "2002",

month = may,

day = "27",

language = "Undefined",

isbn = "geen",

pages = "115--116",

booktitle = "Inf. Digest IEEE European Test Conference",

}