Abstract
The required dependability of integrated CMOS systems has to be continuously increased because nowadays many applications are safety-critical. Having a good knowledge of potential realistic faults plays an important role in this case. The most difficult and expensive category of faults that can occur are the no-faults found (NFF). We have investigated the influence of intermittent resistive faults (IRF), an NFF resulting from e.g. cracks in ball-grid array-to-board interconnections and on-chip interconnections. Previous circuit simulations from us have indicated the potential effect of IRFs on the behavior of analogue as well as simple digital CMOS circuits. In this paper, a hardware IRF generator is presented to accelerate the IRF fault injection process. As a case study, a digital CMOS UART is selected and experimental results for software and hardware-based fault injections are provided. The experimental results demonstrate that the IRF fault injection can be accelerated by 7 orders of magnitude.
Original language | Undefined |
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Title of host publication | IEEE 2016 Euromicro Conference on Digital System Design (DSD) |
Place of Publication | USA |
Publisher | IEEE Circuits & Systems Society |
Pages | 703-707 |
Number of pages | 5 |
ISBN (Print) | 978-1-5090-2817-7 |
DOIs | |
Publication status | Published - 27 Oct 2016 |
Event | 19th EUROMICRO Conference on Digital System Design, DSD 2016 - St. Raphael Hotel, Limassol, Cyprus Duration: 31 Aug 2016 → 2 Sep 2016 Conference number: 19 http://dsd-seaa2016.cs.ucy.ac.cy/index.php?p=DSD2016 |
Publication series
Name | |
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Publisher | IEEE Circuits & Systems Society |
Conference
Conference | 19th EUROMICRO Conference on Digital System Design, DSD 2016 |
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Abbreviated title | DSD |
Country | Cyprus |
City | Limassol |
Period | 31/08/16 → 2/09/16 |
Internet address |
Keywords
- CAES-TDT: Testable Design and Test
- METIS-321677
- intermittent fault
- No Fault Found
- IR-103191
- EWI-27609