Testing for intermittent resistive faults in CMOS integrated systems

Hassan Ebrahimi, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)

    Abstract

    The required dependability of integrated CMOS systems has to be continuously increased because nowadays many applications are safety-critical. Having a good knowledge of potential realistic faults plays an important role in this case. The most difficult and expensive category of faults that can occur are the no-faults found (NFF). We have investigated the influence of intermittent resistive faults (IRF), an NFF resulting from e.g. cracks in ball-grid array-to-board interconnections and on-chip interconnections. Previous circuit simulations from us have indicated the potential effect of IRFs on the behavior of analogue as well as simple digital CMOS circuits. In this paper, a hardware IRF generator is presented to accelerate the IRF fault injection process. As a case study, a digital CMOS UART is selected and experimental results for software and hardware-based fault injections are provided. The experimental results demonstrate that the IRF fault injection can be accelerated by 7 orders of magnitude.
    Original languageUndefined
    Title of host publicationIEEE 2016 Euromicro Conference on Digital System Design (DSD)
    Place of PublicationUSA
    PublisherIEEE Circuits & Systems Society
    Pages703-707
    Number of pages5
    ISBN (Print)978-1-5090-2817-7
    DOIs
    Publication statusPublished - 27 Oct 2016
    Event19th EUROMICRO Conference on Digital System Design, DSD 2016 - St. Raphael Hotel, Limassol, Cyprus
    Duration: 31 Aug 20162 Sep 2016
    Conference number: 19
    http://dsd-seaa2016.cs.ucy.ac.cy/index.php?p=DSD2016

    Publication series

    Name
    PublisherIEEE Circuits & Systems Society

    Conference

    Conference19th EUROMICRO Conference on Digital System Design, DSD 2016
    Abbreviated titleDSD
    CountryCyprus
    CityLimassol
    Period31/08/162/09/16
    Internet address

    Keywords

    • CAES-TDT: Testable Design and Test
    • METIS-321677
    • intermittent fault
    • No Fault Found
    • IR-103191
    • EWI-27609

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