Testing for intermittent resistive faults in CMOS integrated systems

Hassan Ebrahimi; Hans G. Kerkhoff

doi:10.1109/DSD.2016.58

Testing for intermittent resistive faults in CMOS integrated systems

Hassan Ebrahimi
, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

6 Citations (Scopus)

6 Downloads (Pure)

Abstract

The required dependability of integrated CMOS systems has to be continuously increased because nowadays many applications are safety-critical. Having a good knowledge of potential realistic faults plays an important role in this case. The most difficult and expensive category of faults that can occur are the no-faults found (NFF). We have investigated the influence of intermittent resistive faults (IRF), an NFF resulting from e.g. cracks in ball-grid array-to-board interconnections and on-chip interconnections. Previous circuit simulations from us have indicated the potential effect of IRFs on the behavior of analogue as well as simple digital CMOS circuits. In this paper, a hardware IRF generator is presented to accelerate the IRF fault injection process. As a case study, a digital CMOS UART is selected and experimental results for software and hardware-based fault injections are provided. The experimental results demonstrate that the IRF fault injection can be accelerated by 7 orders of magnitude.

Original language	English
Title of host publication	IEEE 2016 Euromicro Conference on Digital System Design (DSD)
Place of Publication	USA
Publisher	IEEE
Pages	703-707
Number of pages	5
ISBN (Print)	978-1-5090-2817-7
DOIs	https://doi.org/10.1109/DSD.2016.58
Publication status	Published - 27 Oct 2016
Event	19th EUROMICRO Conference on Digital System Design, DSD 2016 - St. Raphael Hotel, Limassol, Cyprus Duration: 31 Aug 2016 → 2 Sept 2016 Conference number: 19 http://dsd-seaa2016.cs.ucy.ac.cy/index.php?p=DSD2016

Conference

Conference	19th EUROMICRO Conference on Digital System Design, DSD 2016
Abbreviated title	DSD
Country/Territory	Cyprus
City	Limassol
Period	31/08/16 → 2/09/16
Internet address	http://dsd-seaa2016.cs.ucy.ac.cy/index.php?p=DSD2016

Keywords

n/a OA procedure
CAES-TDT: Testable Design and Test
intermittent fault
No Fault Found

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10.1109/DSD.2016.58

Cite this

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title = "Testing for intermittent resistive faults in CMOS integrated systems",

abstract = "The required dependability of integrated CMOS systems has to be continuously increased because nowadays many applications are safety-critical. Having a good knowledge of potential realistic faults plays an important role in this case. The most difficult and expensive category of faults that can occur are the no-faults found (NFF). We have investigated the influence of intermittent resistive faults (IRF), an NFF resulting from e.g. cracks in ball-grid array-to-board interconnections and on-chip interconnections. Previous circuit simulations from us have indicated the potential effect of IRFs on the behavior of analogue as well as simple digital CMOS circuits. In this paper, a hardware IRF generator is presented to accelerate the IRF fault injection process. As a case study, a digital CMOS UART is selected and experimental results for software and hardware-based fault injections are provided. The experimental results demonstrate that the IRF fault injection can be accelerated by 7 orders of magnitude.",

keywords = "n/a OA procedure, CAES-TDT: Testable Design and Test, intermittent fault, No Fault Found",

author = "Hassan Ebrahimi and Kerkhoff, \{Hans G.\}",

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booktitle = "IEEE 2016 Euromicro Conference on Digital System Design (DSD)",

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note = "19th EUROMICRO Conference on Digital System Design, DSD 2016, DSD ; Conference date: 31-08-2016 Through 02-09-2016",

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AU - Ebrahimi, Hassan

AU - Kerkhoff, Hans G.

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Y1 - 2016/10/27

N2 - The required dependability of integrated CMOS systems has to be continuously increased because nowadays many applications are safety-critical. Having a good knowledge of potential realistic faults plays an important role in this case. The most difficult and expensive category of faults that can occur are the no-faults found (NFF). We have investigated the influence of intermittent resistive faults (IRF), an NFF resulting from e.g. cracks in ball-grid array-to-board interconnections and on-chip interconnections. Previous circuit simulations from us have indicated the potential effect of IRFs on the behavior of analogue as well as simple digital CMOS circuits. In this paper, a hardware IRF generator is presented to accelerate the IRF fault injection process. As a case study, a digital CMOS UART is selected and experimental results for software and hardware-based fault injections are provided. The experimental results demonstrate that the IRF fault injection can be accelerated by 7 orders of magnitude.

AB - The required dependability of integrated CMOS systems has to be continuously increased because nowadays many applications are safety-critical. Having a good knowledge of potential realistic faults plays an important role in this case. The most difficult and expensive category of faults that can occur are the no-faults found (NFF). We have investigated the influence of intermittent resistive faults (IRF), an NFF resulting from e.g. cracks in ball-grid array-to-board interconnections and on-chip interconnections. Previous circuit simulations from us have indicated the potential effect of IRFs on the behavior of analogue as well as simple digital CMOS circuits. In this paper, a hardware IRF generator is presented to accelerate the IRF fault injection process. As a case study, a digital CMOS UART is selected and experimental results for software and hardware-based fault injections are provided. The experimental results demonstrate that the IRF fault injection can be accelerated by 7 orders of magnitude.

KW - n/a OA procedure

KW - CAES-TDT: Testable Design and Test

KW - intermittent fault

KW - No Fault Found

U2 - 10.1109/DSD.2016.58

DO - 10.1109/DSD.2016.58

M3 - Conference contribution

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EP - 707

BT - IEEE 2016 Euromicro Conference on Digital System Design (DSD)

PB - IEEE

CY - USA

T2 - 19th EUROMICRO Conference on Digital System Design, DSD 2016

Y2 - 31 August 2016 through 2 September 2016

ER -

Testing for intermittent resistive faults in CMOS integrated systems

Abstract

Conference

Keywords

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