Testing for Small Delay-Faults in Complex Programmable Logic Devices

Hans G. Kerkhoff, M. Sachdev, H. Speek

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationMESA dag Enschede The Netherlands
    Publication statusPublished - 11 Jun 1997

    Keywords

    • METIS-114732

    Cite this