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Testing for Small Delay-Faults in Complex Programmable Logic Devices

  • Hans G. Kerkhoff
  • , M. Sachdev
  • , H. Speek

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationMESA dag Enschede The Netherlands
    Publication statusPublished - 11 Jun 1997

    Keywords

    • METIS-114732

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