Testing of a Microanalysis System

Hans G. Kerkhoff

doi:10.1109/19.982932

Testing of a Microanalysis System

Hans G. Kerkhoff

Research output: Contribution to journal › Article › Academic › peer-review

4 Citations (Scopus)

148 Downloads (Pure)

Abstract

During the testing of microsystems, one has to cope with many problems resulting from inaccessibility, different technologies, and nonelectrical failure modes. A number of mixed-signal test techniques have been applied to test a new advanced microsystem. The choices on testing are directly dependent on implementation form and application area of the microsystem. Mixed-signal testing approaches are a key factor in this environment

Original language	Undefined
Pages (from-to)	1050-1055
Number of pages	6
Journal	IEEE transactions on instrumentation and measurement
Volume	50
Issue number	6
DOIs	https://doi.org/10.1109/19.982932
Publication status	Published - 2001

Keywords

METIS-201748
IR-42518

Access to Document

10.1109/19.982932

testing_microanalysisis_system-kerkhoff

Cite this

@article{b934edd8a2d14fdbaa9c8140aa769277,

title = "Testing of a Microanalysis System",

abstract = "During the testing of microsystems, one has to cope with many problems resulting from inaccessibility, different technologies, and nonelectrical failure modes. A number of mixed-signal test techniques have been applied to test a new advanced microsystem. The choices on testing are directly dependent on implementation form and application area of the microsystem. Mixed-signal testing approaches are a key factor in this environment",

keywords = "METIS-201748, IR-42518",

author = "Kerkhoff, {Hans G.}",

year = "2001",

doi = "10.1109/19.982932",

language = "Undefined",

volume = "50",

pages = "1050--1055",

journal = "IEEE transactions on instrumentation and measurement",

issn = "0018-9456",

publisher = "IEEE",

number = "6",

}

TY - JOUR

T1 - Testing of a Microanalysis System

AU - Kerkhoff, Hans G.

PY - 2001

Y1 - 2001

N2 - During the testing of microsystems, one has to cope with many problems resulting from inaccessibility, different technologies, and nonelectrical failure modes. A number of mixed-signal test techniques have been applied to test a new advanced microsystem. The choices on testing are directly dependent on implementation form and application area of the microsystem. Mixed-signal testing approaches are a key factor in this environment

AB - During the testing of microsystems, one has to cope with many problems resulting from inaccessibility, different technologies, and nonelectrical failure modes. A number of mixed-signal test techniques have been applied to test a new advanced microsystem. The choices on testing are directly dependent on implementation form and application area of the microsystem. Mixed-signal testing approaches are a key factor in this environment

KW - METIS-201748

KW - IR-42518

U2 - 10.1109/19.982932

DO - 10.1109/19.982932

M3 - Article

SN - 0018-9456

VL - 50

SP - 1050

EP - 1055

JO - IEEE transactions on instrumentation and measurement

JF - IEEE transactions on instrumentation and measurement

IS - 6

ER -