Testing of a Microanalysis System

Hans G. Kerkhoff

    Research output: Contribution to journalArticleAcademicpeer-review

    4 Citations (Scopus)
    110 Downloads (Pure)


    During the testing of microsystems, one has to cope with many problems resulting from inaccessibility, different technologies, and nonelectrical failure modes. A number of mixed-signal test techniques have been applied to test a new advanced microsystem. The choices on testing are directly dependent on implementation form and application area of the microsystem. Mixed-signal testing approaches are a key factor in this environment
    Original languageUndefined
    Pages (from-to)1050-1055
    Number of pages6
    JournalIEEE transactions on instrumentation and measurement
    Issue number6
    Publication statusPublished - 2001


    • METIS-201748
    • IR-42518

    Cite this