Testing of a Microanalysis System

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    Abstract

    During the testing of microsystems, one has to cope with many problems resulting from inaccessibility, different technologies, and nonelectrical failure modes. A number of mixed-signal test techniques have been applied to test a new advanced microsystem. The choices on testing are directly dependent on implementation form and application area of the microsystem. Mixed-signal testing approaches are a key factor in this environment
    Original languageUndefined
    Pages (from-to)1050-1055
    Number of pages6
    JournalIEEE transactions on instrumentation and measurement
    Volume50
    Issue number6
    DOIs
    Publication statusPublished - 2001

    Keywords

    • METIS-201748
    • IR-42518

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