Testing of Microsystems

Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the Microsystems Symposium
    Place of PublicationDelft, the Netherlands
    Pages27-36
    Publication statusPublished - 1 Sep 1998

    Keywords

    • METIS-113007

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