Testing of Parametric Faults in Embedded Analog Cores of System-on-Chip

M. Stancic, L. Fang, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of Prorisc 2000
    Place of PublicationVeldhoven, The Netherlands
    Pages515-518
    Publication statusPublished - 30 Nov 2000

    Keywords

    • METIS-113009

    Cite this

    Stancic, M., Fang, L., & Kerkhoff, H. G. (2000). Testing of Parametric Faults in Embedded Analog Cores of System-on-Chip. In Proceedings of Prorisc 2000 (pp. 515-518). Veldhoven, The Netherlands.