Testing Philosophy behind the Micro Analysis System

Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Design, Test and Microfabrication of MEMS and MOEMS
Place of Publication	Paris, France
Pages	78-83
Number of pages	6
Publication status	Published - 30 Mar 1999

Keywords

@inproceedings{5031fb70a9db4049b268046ae827329d,

title = "Testing Philosophy behind the Micro Analysis System",

keywords = "METIS-112999",

author = "Kerkhoff, {Hans G.}",

year = "1999",

month = mar,

day = "30",

language = "Undefined",

isbn = "0-8194-3154-0",

pages = "78--83",

booktitle = "Design, Test and Microfabrication of MEMS and MOEMS",

}