Testing Superconductor Logic Integrated Circuits

A.J. Arun, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationDigest of Papers of the IEEE European Test Symposium (ETS)
    Place of PublicationTallinn, Estonia
    Pages239-244
    Number of pages6
    Publication statusPublished - 1 May 2005
    Event10th IEEE European Test Symposium, ETS 2005 - Tallinn, Estonia
    Duration: 22 May 200525 May 2005
    Conference number: 10

    Conference

    Conference10th IEEE European Test Symposium, ETS 2005
    Abbreviated titleETS
    CountryEstonia
    CityTallinn
    Period22/05/0525/05/05

    Keywords

    • METIS-226919

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